Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Dynamic dispatching system using a deep denoising autoencoder for semiconductor manufacturing

Full metadata record
DC Field Value Language
dc.contributor.authorLee, Sangmin-
dc.contributor.authorKim, Hae Joong-
dc.contributor.authorKim, Seoung Bum-
dc.date.accessioned2021-08-31T14:56:07Z-
dc.date.available2021-08-31T14:56:07Z-
dc.date.created2021-06-19-
dc.date.issued2020-01-
dc.identifier.issn1568-4946-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/58443-
dc.description.abstractDeep denoising autoencoders (DDAE), which are variants of the autoencoder, have shown outstanding performance in various machine learning tasks. In this study, we propose using a DDAE to address a dispatching rule selection problem that represents a major problem in semiconductor manufacturing. Recently, the significance of dispatching systems for storage allocation has become more apparent because operational issues lead to transfer inefficiency, resulting in production losses. Further, recent approaches have overlooked the possibility of a class imbalance problem in predicting the best dispatching rule. The main purpose of this study is to examine DDAE-based predictive control of the storage dispatching systems to reduce idle machines and production losses. We conducted an experimental evaluation to compare the predictive performance of DDAE with those of five other novelty detection algorithms. Finally, we compared our adaptive approach with the optimization and existing heuristic approaches to demonstrate the effectiveness and efficiency of the proposed method. The experimental results demonstrated that the proposed method outperformed the existing methods in terms of machine utilizations and throughputs. (C) 2019 Elsevier B.V. All rights reserved.-
dc.languageEnglish-
dc.language.isoen-
dc.publisherELSEVIER-
dc.subjectNOVELTY DETECTION-
dc.subjectRULE SELECTION-
dc.subjectSUPPORT-
dc.titleDynamic dispatching system using a deep denoising autoencoder for semiconductor manufacturing-
dc.typeArticle-
dc.contributor.affiliatedAuthorKim, Seoung Bum-
dc.identifier.doi10.1016/j.asoc.2019.105904-
dc.identifier.scopusid2-s2.0-85075351858-
dc.identifier.wosid000503388200035-
dc.identifier.bibliographicCitationAPPLIED SOFT COMPUTING, v.86-
dc.relation.isPartOfAPPLIED SOFT COMPUTING-
dc.citation.titleAPPLIED SOFT COMPUTING-
dc.citation.volume86-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaComputer Science-
dc.relation.journalWebOfScienceCategoryComputer Science, Artificial Intelligence-
dc.relation.journalWebOfScienceCategoryComputer Science, Interdisciplinary Applications-
dc.subject.keywordPlusNOVELTY DETECTION-
dc.subject.keywordPlusRULE SELECTION-
dc.subject.keywordPlusSUPPORT-
dc.subject.keywordAuthorDeep denoising autoencoder-
dc.subject.keywordAuthorNovelty detection-
dc.subject.keywordAuthorDispatching rule selection-
dc.subject.keywordAuthorStorage allocation-
dc.subject.keywordAuthorClass imbalance problem-
Files in This Item
There are no files associated with this item.
Appears in
Collections
College of Engineering > School of Industrial and Management Engineering > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher KIM, Seoung Bum photo

KIM, Seoung Bum
공과대학 (산업경영공학부)
Read more

Altmetrics

Total Views & Downloads

BROWSE