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Comparative study of PIN photodiodes for a low energy X-ray sensor between manufactured with three diverse wafer resistivity

Authors
Yi Yun
Keywords
PIN photodiode, wafer resistivity, low-energy X-ray
Publisher
Max-Planck-Institut Halbleiterlabor
Citation
11th European Symposium on Semiconductor Detectors
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/63134
Conference Name
11th European Symposium on Semiconductor Detectors
Place
GE
Wildbad Kreuth, Germany
Conference Date
2009-06-07
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College of Science and Technology > Department of Electronics and Information Engineering > 2. Conference Papers

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