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Noise analysis of the Charge Sensitive Amplifier (CSA) for Photodetection
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Yi Yun | - |
| dc.date.accessioned | 2021-09-01T10:39:15Z | - |
| dc.date.available | 2021-09-01T10:39:15Z | - |
| dc.date.created | 2021-04-22 | - |
| dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/63764 | - |
| dc.publisher | Max-Planck-Institut Halbleiterlabor | - |
| dc.subject | CSA, noise analysis, thermal noise, 1/f noise, parallel noise | - |
| dc.title | Noise analysis of the Charge Sensitive Amplifier (CSA) for Photodetection | - |
| dc.type | Conference | - |
| dc.contributor.affiliatedAuthor | Yi Yun | - |
| dc.identifier.bibliographicCitation | 11th European Symposium on Semiconductor Detectors | - |
| dc.relation.isPartOf | 11th European Symposium on Semiconductor Detectors | - |
| dc.citation.title | 11th European Symposium on Semiconductor Detectors | - |
| dc.citation.conferencePlace | GE | - |
| dc.citation.conferencePlace | Wildbad Kreuth, Germany | - |
| dc.citation.conferenceDate | 2009-06-07 | - |
| dc.type.rims | CONF | - |
| dc.description.journalClass | 1 | - |
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