Control of tunneling gap between nanocrystals by introduction of solution processed interfacial layers for wearable sensor applications
DC Field | Value | Language |
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dc.contributor.author | Hossain, Md Ashraf | - |
dc.contributor.author | Jeon, Sanghyun | - |
dc.contributor.author | Ahn, Junhyuk | - |
dc.contributor.author | Joh, Hyungmok | - |
dc.contributor.author | Bang, Junsung | - |
dc.contributor.author | Oh, Soong Ju | - |
dc.date.accessioned | 2021-09-01T14:50:46Z | - |
dc.date.available | 2021-09-01T14:50:46Z | - |
dc.date.created | 2021-06-19 | - |
dc.date.issued | 2019-05-25 | - |
dc.identifier.issn | 1226-086X | - |
dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/65376 | - |
dc.description.abstract | In this study, we introduce a strategy to introduce solution-processed interfacial layers in nanocrystal (NC) thin films to fabricate high-performance strain sensors. SiO2 interfacial layers are chemically introduced in ligand-exchanged Ag NC thin films to increase the tunneling gap or inter-particle distance between each Ag NC. In this way, the charge-transport mechanism is manipulated, leading to unique electromechanical properties with a high gauge factor. All solution-processed strain gauge sensors with high stability, durability, and sensitivity are fabricated. The sensor successfully measured delicate movements such as finger motions, demonstrating its possible application in electronic skin. (C) 2019 The Korean Society of Industrial and Engineering Chemistry. Published by Elsevier B.V. All rights reserved. | - |
dc.language | English | - |
dc.language.iso | en | - |
dc.publisher | ELSEVIER SCIENCE INC | - |
dc.subject | STRAIN SENSORS | - |
dc.subject | CHARGE-TRANSPORT | - |
dc.subject | RECENT PROGRESS | - |
dc.subject | MONOLAYERS | - |
dc.subject | COATINGS | - |
dc.subject | GROWTH | - |
dc.title | Control of tunneling gap between nanocrystals by introduction of solution processed interfacial layers for wearable sensor applications | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Oh, Soong Ju | - |
dc.identifier.doi | 10.1016/j.jiec.2019.01.027 | - |
dc.identifier.scopusid | 2-s2.0-85060860982 | - |
dc.identifier.wosid | 000462419300024 | - |
dc.identifier.bibliographicCitation | JOURNAL OF INDUSTRIAL AND ENGINEERING CHEMISTRY, v.73, pp.214 - 220 | - |
dc.relation.isPartOf | JOURNAL OF INDUSTRIAL AND ENGINEERING CHEMISTRY | - |
dc.citation.title | JOURNAL OF INDUSTRIAL AND ENGINEERING CHEMISTRY | - |
dc.citation.volume | 73 | - |
dc.citation.startPage | 214 | - |
dc.citation.endPage | 220 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.identifier.kciid | ART002466403 | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.description.journalRegisteredClass | kci | - |
dc.relation.journalResearchArea | Chemistry | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalWebOfScienceCategory | Chemistry, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Engineering, Chemical | - |
dc.subject.keywordPlus | STRAIN SENSORS | - |
dc.subject.keywordPlus | CHARGE-TRANSPORT | - |
dc.subject.keywordPlus | RECENT PROGRESS | - |
dc.subject.keywordPlus | MONOLAYERS | - |
dc.subject.keywordPlus | COATINGS | - |
dc.subject.keywordPlus | GROWTH | - |
dc.subject.keywordAuthor | Silver nanocrystal | - |
dc.subject.keywordAuthor | Tunneling gap | - |
dc.subject.keywordAuthor | SiO2 interfacial layers | - |
dc.subject.keywordAuthor | Solution process | - |
dc.subject.keywordAuthor | Strain sensor | - |
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