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Control of tunneling gap between nanocrystals by introduction of solution processed interfacial layers for wearable sensor applications

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dc.contributor.authorHossain, Md Ashraf-
dc.contributor.authorJeon, Sanghyun-
dc.contributor.authorAhn, Junhyuk-
dc.contributor.authorJoh, Hyungmok-
dc.contributor.authorBang, Junsung-
dc.contributor.authorOh, Soong Ju-
dc.date.accessioned2021-09-01T14:50:46Z-
dc.date.available2021-09-01T14:50:46Z-
dc.date.created2021-06-19-
dc.date.issued2019-05-25-
dc.identifier.issn1226-086X-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/65376-
dc.description.abstractIn this study, we introduce a strategy to introduce solution-processed interfacial layers in nanocrystal (NC) thin films to fabricate high-performance strain sensors. SiO2 interfacial layers are chemically introduced in ligand-exchanged Ag NC thin films to increase the tunneling gap or inter-particle distance between each Ag NC. In this way, the charge-transport mechanism is manipulated, leading to unique electromechanical properties with a high gauge factor. All solution-processed strain gauge sensors with high stability, durability, and sensitivity are fabricated. The sensor successfully measured delicate movements such as finger motions, demonstrating its possible application in electronic skin. (C) 2019 The Korean Society of Industrial and Engineering Chemistry. Published by Elsevier B.V. All rights reserved.-
dc.languageEnglish-
dc.language.isoen-
dc.publisherELSEVIER SCIENCE INC-
dc.subjectSTRAIN SENSORS-
dc.subjectCHARGE-TRANSPORT-
dc.subjectRECENT PROGRESS-
dc.subjectMONOLAYERS-
dc.subjectCOATINGS-
dc.subjectGROWTH-
dc.titleControl of tunneling gap between nanocrystals by introduction of solution processed interfacial layers for wearable sensor applications-
dc.typeArticle-
dc.contributor.affiliatedAuthorOh, Soong Ju-
dc.identifier.doi10.1016/j.jiec.2019.01.027-
dc.identifier.scopusid2-s2.0-85060860982-
dc.identifier.wosid000462419300024-
dc.identifier.bibliographicCitationJOURNAL OF INDUSTRIAL AND ENGINEERING CHEMISTRY, v.73, pp.214 - 220-
dc.relation.isPartOfJOURNAL OF INDUSTRIAL AND ENGINEERING CHEMISTRY-
dc.citation.titleJOURNAL OF INDUSTRIAL AND ENGINEERING CHEMISTRY-
dc.citation.volume73-
dc.citation.startPage214-
dc.citation.endPage220-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.identifier.kciidART002466403-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.description.journalRegisteredClasskci-
dc.relation.journalResearchAreaChemistry-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalWebOfScienceCategoryChemistry, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryEngineering, Chemical-
dc.subject.keywordPlusSTRAIN SENSORS-
dc.subject.keywordPlusCHARGE-TRANSPORT-
dc.subject.keywordPlusRECENT PROGRESS-
dc.subject.keywordPlusMONOLAYERS-
dc.subject.keywordPlusCOATINGS-
dc.subject.keywordPlusGROWTH-
dc.subject.keywordAuthorSilver nanocrystal-
dc.subject.keywordAuthorTunneling gap-
dc.subject.keywordAuthorSiO2 interfacial layers-
dc.subject.keywordAuthorSolution process-
dc.subject.keywordAuthorStrain sensor-
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