Detector performance and defect densities in CdZnTe after two-step annealing
DC Field | Value | Language |
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dc.contributor.author | Kim, Eunhye | - |
dc.contributor.author | Kim, Yonghoon | - |
dc.contributor.author | Bolotnikov, A. E. | - |
dc.contributor.author | James, R. B. | - |
dc.contributor.author | Kim, Kihyun | - |
dc.date.accessioned | 2021-09-01T16:10:18Z | - |
dc.date.available | 2021-09-01T16:10:18Z | - |
dc.date.created | 2021-06-19 | - |
dc.date.issued | 2019-04-11 | - |
dc.identifier.issn | 0168-9002 | - |
dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/66022 | - |
dc.description.abstract | Defects both microscale and nanoscale are play an important role in CdZnTe (CZT) device performance. Typical micro-scale defects such as Te inclusions were removed via a two-step annealing process, and their concentration was analyzed via IR transmission microscopy. In addition, transmission electron microscopy (TEM) measurement was employed to investigate the evolution of nano-scale defects after the annealing process. Dislocation and stacking faults were commonly observed defects in as-grown and annealed CZT. The line shape defects, which are possibly related to the stress field around dislocations, disappeared during the in-situ the annealing at 200-220 C. A Frisch-grid CZT detector made via the two-step annealing process exhibited improved energy resolution and low backscattering counts in Cs-137 gamma spectra. | - |
dc.language | English | - |
dc.language.iso | en | - |
dc.publisher | ELSEVIER | - |
dc.title | Detector performance and defect densities in CdZnTe after two-step annealing | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Kim, Kihyun | - |
dc.identifier.doi | 10.1016/j.nima.2019.01.064 | - |
dc.identifier.scopusid | 2-s2.0-85060710764 | - |
dc.identifier.wosid | 000459034800009 | - |
dc.identifier.bibliographicCitation | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, v.923, pp.51 - 54 | - |
dc.relation.isPartOf | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | - |
dc.citation.title | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | - |
dc.citation.volume | 923 | - |
dc.citation.startPage | 51 | - |
dc.citation.endPage | 54 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Instruments & Instrumentation | - |
dc.relation.journalResearchArea | Nuclear Science & Technology | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Instruments & Instrumentation | - |
dc.relation.journalWebOfScienceCategory | Nuclear Science & Technology | - |
dc.relation.journalWebOfScienceCategory | Physics, Nuclear | - |
dc.relation.journalWebOfScienceCategory | Physics, Particles & Fields | - |
dc.subject.keywordAuthor | CdZnTe | - |
dc.subject.keywordAuthor | Nanoscale defects | - |
dc.subject.keywordAuthor | Microscale defects | - |
dc.subject.keywordAuthor | Annealing | - |
dc.subject.keywordAuthor | Dislocation | - |
dc.subject.keywordAuthor | Stacking fault | - |
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