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Exploiting Narrow-Width Values for Thermal-Aware Register File Designs
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Sung Woo Chung | - |
| dc.date.accessioned | 2021-09-01T18:34:00Z | - |
| dc.date.available | 2021-09-01T18:34:00Z | - |
| dc.date.created | 2021-04-22 | - |
| dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/67317 | - |
| dc.publisher | IEEE | - |
| dc.title | Exploiting Narrow-Width Values for Thermal-Aware Register File Designs | - |
| dc.type | Conference | - |
| dc.contributor.affiliatedAuthor | Sung Woo Chung | - |
| dc.identifier.bibliographicCitation | Design, Automation and Test in Europe Conference | - |
| dc.relation.isPartOf | Design, Automation and Test in Europe Conference | - |
| dc.citation.title | Design, Automation and Test in Europe Conference | - |
| dc.citation.conferencePlace | FR | - |
| dc.citation.conferenceDate | 2009-04-14 | - |
| dc.type.rims | CONF | - |
| dc.description.journalClass | 1 | - |
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