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Mechanism underlying synaptic depression and conduction block secondary to hypoxic insult

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dc.contributor.authorCHUNG, HUNG-SEOB-
dc.date.accessioned2021-09-01T20:33:25Z-
dc.date.available2021-09-01T20:33:25Z-
dc.date.created2021-04-22-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/68021-
dc.publisherThe Japan Spciety of Neurotraumatology-
dc.titleMechanism underlying synaptic depression and conduction block secondary to hypoxic insult-
dc.typeConference-
dc.contributor.affiliatedAuthorCHUNG, HUNG-SEOB-
dc.identifier.bibliographicCitationThe 31st Annual Meeting of The Japan Society of Neurotraumatology-
dc.relation.isPartOfThe 31st Annual Meeting of The Japan Society of Neurotraumatology-
dc.citation.titleThe 31st Annual Meeting of The Japan Society of Neurotraumatology-
dc.citation.conferencePlaceJA-
dc.citation.conferencePlaceJapan-
dc.citation.conferenceDate2008-04-25-
dc.type.rimsCONF-
dc.description.journalClass1-
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