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Joint modeling of cluster size and clustered failure times

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dc.contributor.authorLEE, JAE WON-
dc.date.accessioned2021-09-01T22:05:11Z-
dc.date.available2021-09-01T22:05:11Z-
dc.date.created2021-04-22-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/68520-
dc.publisherEastern North American Region Meeting-
dc.titleJoint modeling of cluster size and clustered failure times-
dc.typeConference-
dc.contributor.affiliatedAuthorLEE, JAE WON-
dc.identifier.bibliographicCitationEastern North American Region Meeting - Internation Biometric Society-
dc.relation.isPartOfEastern North American Region Meeting - Internation Biometric Society-
dc.citation.titleEastern North American Region Meeting - Internation Biometric Society-
dc.citation.conferencePlaceUS-
dc.citation.conferenceDate2008-03-16-
dc.type.rimsCONF-
dc.description.journalClass1-
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정경대학 (통계학과)
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