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Small-Area High-Accuracy ODT/OCD by calibration of Global On-Chip for 512M GDDR5 application
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | KIM, Chulwoo | - |
| dc.date.accessioned | 2021-09-02T01:57:41Z | - |
| dc.date.available | 2021-09-02T01:57:41Z | - |
| dc.date.created | 2021-04-22 | - |
| dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/71086 | - |
| dc.publisher | IEEE | - |
| dc.title | Small-Area High-Accuracy ODT/OCD by calibration of Global On-Chip for 512M GDDR5 application | - |
| dc.type | Conference | - |
| dc.contributor.affiliatedAuthor | KIM, Chulwoo | - |
| dc.identifier.bibliographicCitation | IEEE Custom Integrated Circuits Conference, pp.717 - 720 | - |
| dc.relation.isPartOf | IEEE Custom Integrated Circuits Conference | - |
| dc.citation.title | IEEE Custom Integrated Circuits Conference | - |
| dc.citation.startPage | 717 | - |
| dc.citation.endPage | 720 | - |
| dc.citation.conferencePlace | US | - |
| dc.citation.conferenceDate | 2009-11-03 | - |
| dc.type.rims | CONF | - |
| dc.description.journalClass | 1 | - |
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Collections - College of Engineering > School of Electrical Engineering > 2. Conference Papers
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