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The failure analysis of PRAM device based on Ge2Sb2Te5
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Lee, Heon | - |
| dc.date.accessioned | 2021-09-02T02:58:42Z | - |
| dc.date.available | 2021-09-02T02:58:42Z | - |
| dc.date.created | 2021-04-22 | - |
| dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/71640 | - |
| dc.publisher | 대한금속재료학회 | - |
| dc.title | The failure analysis of PRAM device based on Ge2Sb2Te5 | - |
| dc.type | Conference | - |
| dc.contributor.affiliatedAuthor | Lee, Heon | - |
| dc.identifier.bibliographicCitation | 2008 대한금속재료학회 추계학술대회 | - |
| dc.relation.isPartOf | 2008 대한금속재료학회 추계학술대회 | - |
| dc.citation.title | 2008 대한금속재료학회 추계학술대회 | - |
| dc.citation.conferencePlace | KO | - |
| dc.citation.conferenceDate | 2008-10-24 | - |
| dc.type.rims | CONF | - |
| dc.description.journalClass | 2 | - |
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