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Measurement of low-energy events due to Rn-222 daughter contamination on the surface of a NaI(Tl) crystal
- Authors
- Kim, K. W.; Ha, C.; Kim, N. Y.; Kim, Y. D.; Lee, H. S.; Park, B. J.; Park, H. K.
- Issue Date
- 11월-2018
- Publisher
- ELSEVIER
- Keywords
- Dark matter; WIMP; Nal(TI); Surface Pb-210
- Citation
- ASTROPARTICLE PHYSICS, v.102, pp.51 - 55
- Indexed
- SCIE
SCOPUS
- Journal Title
- ASTROPARTICLE PHYSICS
- Volume
- 102
- Start Page
- 51
- End Page
- 55
- ISSN
- 0927-6505
- Abstract
- It has been known that decays of daughter elements of Rn-222 on the surface of a detector cause significant background at energies below 10 keV. In particular Pb-210 and Po-210 decays on the crystal surface result in significant background for dark matter search experiments with Nal(Tl) crystals. In this report, measurement of Pb-210 and Po-210 decays on surfaces are obtained by using a Rn-222 contaminated crystal. Alpha decay events of Po-210 on the surface are measured by coincidence requirements of two attached crystals. Due to recoiling of Pb-206, rapid nuclear recoil events are observed. A mean time characterization demonstrates that Pb-206 recoil events can be statistically separated from those of sodium or iodine nuclear recoil events, as well as electron recoil events. (C) 2018 Elsevier B.V. All rights reserved.
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Collections - Graduate School > Department of Accelerator Science > 1. Journal Articles
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