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Heterostructure WSe2-Ga2O3 Junction Field-Effect Transistor for Low-Dimensional High-Power Electronics

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dc.contributor.authorKim, Janghyuk-
dc.contributor.authorMastro, Michael A.-
dc.contributor.authorTadjer, Marko J.-
dc.contributor.authorKim, Jihyun-
dc.date.accessioned2021-09-02T06:30:24Z-
dc.date.available2021-09-02T06:30:24Z-
dc.date.created2021-06-16-
dc.date.issued2018-09-05-
dc.identifier.issn1944-8244-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/73137-
dc.description.abstractLayered materials separated from each bulk crystal can be assembled to form a strain-free heterostructure by using the van der Waals interaction. We demonstrated a heterostructure n-channel depletion-mode beta-Ga2O3 junction field-effect transistor (JFET) through van der Waals bonding with an exfoliated p-WSe2 flake. Typical diode characteristics with a high rectifying ratio of similar to 10(5) were observed in a p-WSe2/n-Ga2O3 heterostructure diode, where WSe2 and beta-Ga2O3 were obtained by mechanically exfoliating each crystal. Layered JFETs exhibited an excellent I-DS-V-DS output as well as I-DS-V-GS transfer characteristics with a high on/off ratio (similar to 10(8)) and low subthreshold swing (133 mV/dec). Saturated output currents were observed with a threshold voltage of -5.1 V and a three-terminal breakdown voltage of +144 V. Electrical performances of the fabricated heterostructure JFET were maintained at elevated temperatures with outstanding air stability. Our WSe2-Ga2O3 heterostructure JFET paves the way to the low-dimensional high-power devices, enabling miniaturization of the integrated power electronic systems.-
dc.languageEnglish-
dc.language.isoen-
dc.publisherAMER CHEMICAL SOC-
dc.subjectMOS2-
dc.subjectHETEROJUNCTION-
dc.subjectPERFORMANCE-
dc.subjectGROWTH-
dc.subjectDIODE-
dc.titleHeterostructure WSe2-Ga2O3 Junction Field-Effect Transistor for Low-Dimensional High-Power Electronics-
dc.typeArticle-
dc.contributor.affiliatedAuthorKim, Jihyun-
dc.identifier.doi10.1021/acsami.8b07030-
dc.identifier.scopusid2-s2.0-85052474259-
dc.identifier.wosid000444355700054-
dc.identifier.bibliographicCitationACS APPLIED MATERIALS & INTERFACES, v.10, no.35, pp.29724 - 29729-
dc.relation.isPartOfACS APPLIED MATERIALS & INTERFACES-
dc.citation.titleACS APPLIED MATERIALS & INTERFACES-
dc.citation.volume10-
dc.citation.number35-
dc.citation.startPage29724-
dc.citation.endPage29729-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaScience & Technology - Other Topics-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalWebOfScienceCategoryNanoscience & Nanotechnology-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.subject.keywordPlusMOS2-
dc.subject.keywordPlusHETEROJUNCTION-
dc.subject.keywordPlusPERFORMANCE-
dc.subject.keywordPlusGROWTH-
dc.subject.keywordPlusDIODE-
dc.subject.keywordAuthorwide bandgap semiconductor-
dc.subject.keywordAuthorheterostructure-
dc.subject.keywordAuthortwo-dimensional material-
dc.subject.keywordAuthorfield-effect transistor-
dc.subject.keywordAuthorgallium oxide-
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