Feature-Learning-Based Printed Circuit Board Inspection via Speeded-Up Robust Features and Random Forest
- Authors
- Yuk, Eun Hye; Park, Seung Hwan; Park, Cheong-Sool; Baek, Jun-Geol
- Issue Date
- 6월-2018
- Publisher
- MDPI
- Keywords
- image inspection; non-referential method; feature extraction; fault pattern learning; weighted kernel density estimation (WKDE)
- Citation
- APPLIED SCIENCES-BASEL, v.8, no.6
- Indexed
- SCIE
SCOPUS
- Journal Title
- APPLIED SCIENCES-BASEL
- Volume
- 8
- Number
- 6
- URI
- https://scholar.korea.ac.kr/handle/2021.sw.korea/75429
- DOI
- 10.3390/app8060932
- ISSN
- 2076-3417
- Abstract
- With the coming of the 4th industrial revolution era, manufacturers produce high-tech products. As the production process is refined, inspection technologies become more important. Specifically, the inspection of a printed circuit board (PCB), which is an indispensable part of electronic products, is an essential step to improve the quality of the process and yield. Image processing techniques are utilized for inspection, but there are limitations because the backgrounds of images are different and the kinds of defects increase. In order to overcome these limitations, methods based on machine learning have been used recently. These methods can inspect without a normal image by learning fault patterns. Therefore, this paper proposes a method can detect various types of defects using machine learning. The proposed method first extracts features through speeded-up robust features (SURF), then learns the fault pattern and calculates probabilities. After that, we generate a weighted kernel density estimation (WKDE) map weighted by the probabilities to consider the density of the features. Because the probability of the WKDE map can detect an area where the defects are concentrated, it improves the performance of the inspection. To verify the proposed method, we apply the method to PCB images and confirm the performance of the method.
- Files in This Item
- There are no files associated with this item.
- Appears in
Collections - College of Engineering > School of Industrial and Management Engineering > 1. Journal Articles
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.