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Mitigation of CMOS Variability with Metal Gate
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Ji-Woon Yang | - |
| dc.date.accessioned | 2021-09-02T13:18:41Z | - |
| dc.date.available | 2021-09-02T13:18:41Z | - |
| dc.date.created | 2021-04-22 | - |
| dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/76528 | - |
| dc.publisher | THE JAPAN SOCIETY OF APPLIED PHYSICS | - |
| dc.title | Mitigation of CMOS Variability with Metal Gate | - |
| dc.type | Conference | - |
| dc.contributor.affiliatedAuthor | Ji-Woon Yang | - |
| dc.identifier.bibliographicCitation | International Conference on. Solid State Devices and Materials | - |
| dc.relation.isPartOf | International Conference on. Solid State Devices and Materials | - |
| dc.citation.title | International Conference on. Solid State Devices and Materials | - |
| dc.citation.conferencePlace | JA | - |
| dc.citation.conferenceDate | 2008-09-23 | - |
| dc.type.rims | CONF | - |
| dc.description.journalClass | 1 | - |
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