Interferometric Scattering Microscopy with Polarization-Selective Dual Detection Scheme: Capturing the Orientational Information of Anisotropic Nanometric Objects

Abstract

Single-particle tracking is a powerful technique to reveal an underlying principle of microscopic phenomena. Here we report an optical microscopy technique, polarization selective interferometric scattering microscopy, that enables us to capture rotational as well as positional information on nanoscale objects. This technique grants all the merits of interferometric scattering microscopy and provides a further advantage of the capability of determining the orientation of single nanoscopic objects in a straightforward and facile way. We anticipate that this technique would be of critical use in rotational tracking of a single anisotropic particle or biological system in the nanoscopic world.