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최적의 동시 병렬 테스트 구현을 위한 테스트 솔루션 개발

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dc.contributor.authorSoo-Won Kim-
dc.date.accessioned2021-09-02T16:32:52Z-
dc.date.available2021-09-02T16:32:52Z-
dc.date.created2021-04-22-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/78132-
dc.publisher대한전자공학회-
dc.title최적의 동시 병렬 테스트 구현을 위한 테스트 솔루션 개발-
dc.typeConference-
dc.contributor.affiliatedAuthorSoo-Won Kim-
dc.identifier.bibliographicCitation대한전자공학회 추계학술대회, pp.415 - 416-
dc.relation.isPartOf대한전자공학회 추계학술대회-
dc.citation.title대한전자공학회 추계학술대회-
dc.citation.startPage415-
dc.citation.endPage416-
dc.citation.conferencePlaceKO-
dc.citation.conferenceDate2008-11-29-
dc.type.rimsCONF-
dc.description.journalClass2-
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