Daehne, Sven; Biessmann, Felix; Samek, Wojciech; Haufe, Stefan; Goltz, Dominique; Gundlach, Christopher; Villringer, Arno; Fazli, Siamac; Muller, Klaus-Robert
ArticleIssue Date2015CitationPROCEEDINGS OF THE IEEE, v.103, no.9, pp.1507 - 1530PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC