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Monitoring Journal-Bearing Faults
- Authors
- Jung, Junyeong; Park, Yonghyun; Lee, Sang Bin; Cho, Chang-Hee; Kim, Kwonhee; Wiedenbrug, Ernesto J.; Teska, Mike
- Issue Date
- 7월-2017
- Publisher
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
- Citation
- IEEE INDUSTRY APPLICATIONS MAGAZINE, v.23, no.4, pp.12 - 21
- Indexed
- SCIE
SCOPUS
- Journal Title
- IEEE INDUSTRY APPLICATIONS MAGAZINE
- Volume
- 23
- Number
- 4
- Start Page
- 12
- End Page
- 21
- ISSN
- 1077-2618
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