Systematic Method to Identify an Area of Vulnerability to Voltage Sags
- Authors
- Park, Chang-Hyun; Jang, Gilsoo
- Issue Date
- 6월-2017
- Publisher
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
- Keywords
- Area of vulnerability (AOV); golden section search; power quality; voltage sags; voltage sag assessment
- Citation
- IEEE TRANSACTIONS ON POWER DELIVERY, v.32, no.3, pp.1583 - 1591
- Indexed
- SCIE
SCOPUS
- Journal Title
- IEEE TRANSACTIONS ON POWER DELIVERY
- Volume
- 32
- Number
- 3
- Start Page
- 1583
- End Page
- 1591
- URI
- https://scholar.korea.ac.kr/handle/2021.sw.korea/83246
- DOI
- 10.1109/TPWRD.2016.2623761
- ISSN
- 0885-8977
- Abstract
- This paper describes a systematic method for determining an area of vulnerability (AOV) to fault induced voltage sags. The concept of an AOV is very useful for evaluating vulnerability and the relationship between sensitive loads and system voltage sag performance. In general, a system performance assessment pertaining to voltage sags requires a determination of AOVs for system buses. Because voltage sags can be caused by remote faults in a transmission system, to completely identify an AOV, a large part of the power system including adjacent circuits and remote supply systems should be considered. Therefore, accurately calculating critical points and identifying AOVs are challenging tasks. In this paper, we present an effective numerical method to determine an accurate AOV in a large scale power system and to overcome limitations of other well-known methods.
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