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High reverse breakdown voltage Schottky rectifiers without edge termination on Ga2O3

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dc.contributor.authorYang, Jiancheng-
dc.contributor.authorAhn, Shihyun-
dc.contributor.authorRen, F.-
dc.contributor.authorPearton, S. J.-
dc.contributor.authorJang, Soohwan-
dc.contributor.authorKim, Jihyun-
dc.contributor.authorKuramata, A.-
dc.date.accessioned2021-09-03T06:14:35Z-
dc.date.available2021-09-03T06:14:35Z-
dc.date.created2021-06-16-
dc.date.issued2017-05-08-
dc.identifier.issn0003-6951-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/83477-
dc.description.abstractVertical geometry Ni/Au-beta-Ga2O3 Schottky rectifiers were fabricated on Hydride Vapor Phase Epitaxy layers on conducting bulk substrates, and the rectifying forward and reverse current-voltage characteristics were measured at temperatures in the range of 25-100 degrees C. The reverse breakdown voltage (V-BR) of these beta-Ga2O3 rectifiers without edge termination was a function of the diode diameter, being in the range of 920-1016V (average value from 25 diodes was 975 +/- 40 V, with 10 of the diodes over 1 kV) for diameters of 105 mu m and consistently 810V (810 +/- 3V for 22 diodes) for a diameter of 210 mu m. The Schottky barrier height decreased from 1.1 at 25 degrees C to 0.94 at 100 degrees C, while the ideality factor increased from 1.08 to 1.28 over the same range. The figure-of-merit (V-BR(2)/R-on), where R-on is the on-state resistance (similar to 6.7 m Omega cm(2)), was approximately 154.07 MW.cm(-2) for the 105 mu m diameter diodes. The reverse recovery time was 26 ns for switching from +5V to -5V. These results represent another impressive advance in the quality of bulk and epitaxial beta-Ga2O3. Published by AIP Publishing.-
dc.languageEnglish-
dc.language.isoen-
dc.publisherAMER INST PHYSICS-
dc.subjectELECTRON-MOBILITY TRANSISTORS-
dc.subjectBARRIER DIODES-
dc.subjectBETA-GA2O3-
dc.subjectDEVICES-
dc.subjectMOVPE-
dc.titleHigh reverse breakdown voltage Schottky rectifiers without edge termination on Ga2O3-
dc.typeArticle-
dc.contributor.affiliatedAuthorKim, Jihyun-
dc.identifier.doi10.1063/1.4983203-
dc.identifier.scopusid2-s2.0-85019079300-
dc.identifier.wosid000402319200012-
dc.identifier.bibliographicCitationAPPLIED PHYSICS LETTERS, v.110, no.19-
dc.relation.isPartOfAPPLIED PHYSICS LETTERS-
dc.citation.titleAPPLIED PHYSICS LETTERS-
dc.citation.volume110-
dc.citation.number19-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordPlusELECTRON-MOBILITY TRANSISTORS-
dc.subject.keywordPlusBARRIER DIODES-
dc.subject.keywordPlusBETA-GA2O3-
dc.subject.keywordPlusDEVICES-
dc.subject.keywordPlusMOVPE-
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