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Negative Capacitance FinFET With Sub-20-mV/decade Subthreshold Slope and Minimal Hysteresis of 0.48 V

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dc.contributor.authorKo, Eunah-
dc.contributor.authorLee, Jae Woo-
dc.contributor.authorShin, Changhwan-
dc.date.accessioned2021-09-03T07:41:41Z-
dc.date.available2021-09-03T07:41:41Z-
dc.date.created2021-06-16-
dc.date.issued2017-04-
dc.identifier.issn0741-3106-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/83926-
dc.description.abstractIn this letter, an n-type short-channel negative capacitance FinFET (NC-FinFET) with a hysteresis window of 0.48 V, an on-/off-current ratio of 10(7), and a sub20- mV/decade average subthreshold slope (SSavg) that is intended to overcome the Boltzmann limit (i. e., the physical limit in the SS, which is 60 mV/decade at 300 K), is experimentally demonstrated vs. a baseline FinFET with an SSavg of similar to 105 mV/decade. In our testing, we confirmed that the large hysteresis window in a short-channel NC-FinFET can be suppressed by using an appropriate source/drain extension length (L-ext). As Lext in the NC-FinFET is increased, the gate-to-source/drain capacitance (C-GS/C-GD) decreased and the hysteresis window narrows.-
dc.languageEnglish-
dc.language.isoen-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.titleNegative Capacitance FinFET With Sub-20-mV/decade Subthreshold Slope and Minimal Hysteresis of 0.48 V-
dc.typeArticle-
dc.contributor.affiliatedAuthorLee, Jae Woo-
dc.identifier.doi10.1109/LED.2017.2672967-
dc.identifier.scopusid2-s2.0-85017580217-
dc.identifier.wosid000398905400002-
dc.identifier.bibliographicCitationIEEE ELECTRON DEVICE LETTERS, v.38, no.4, pp.418 - 421-
dc.relation.isPartOfIEEE ELECTRON DEVICE LETTERS-
dc.citation.titleIEEE ELECTRON DEVICE LETTERS-
dc.citation.volume38-
dc.citation.number4-
dc.citation.startPage418-
dc.citation.endPage421-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.subject.keywordAuthorSteep switching-
dc.subject.keywordAuthornegative capacitance FinFET-
dc.subject.keywordAuthorferroelectric capacitor-
dc.subject.keywordAuthorS/D extension length (L-ext)-
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