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Estimation of optimum scintillator thickness of Si-PM detectors for time-of-flight (TOF)-PET

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dc.contributor.authorNakanishi, Kouhei-
dc.contributor.authorKodani, Kanako-
dc.contributor.authorYeom, Jung Yeol-
dc.contributor.authorYamamoto, Seiichi-
dc.date.accessioned2021-09-03T07:53:41Z-
dc.date.available2021-09-03T07:53:41Z-
dc.date.created2021-06-16-
dc.date.issued2017-04-
dc.identifier.issn2057-1976-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/83991-
dc.description.abstractTime-of-flight (TOF) is an effective method for improving signal-to-noise ratio of the images for PET. Basic performance of TOF-PET such as sensitivity, TOF-gain, and energy resolution depends on the scintillator thickness. Hence, determining the appropriate scintillator thickness is crucial when designing TOF-PET systems. However, the optimal thickness for the Lu-based scintillators is often not clear-cut. In this paper, we introduce a new concept (figure of merit, FOM) to evaluate the optimum scintillator thickness with regards to the above factors for a TOF-PET system employing Lu-based scintillators coupled to silicon photomultipliers (Si-PMs). We optically coupled Lu1.9Gd0.1SiO5 (LGSO) scintillators of different thickness (length) to Si-PMs and measured the timing resolutions with a high bandwidth digital oscilloscope. Then we calculated the TOF-gain for each crystal. We also calculated the coincidence detection efficiencies. Finally, for each LGSO length, we evaluated the relative sensitivity with FOMs that take into account the TOF-gain (TOF-sensitivity). From this study, we found that LGSO with 20-25 mm thickness was optimum based on the calculated TOF-sensitivity FOM. We conclude that the evaluation methods and results can provide an objective method in which one may use to determine the optimum thickness of the scintillators for TOF-PET systems.-
dc.languageEnglish-
dc.language.isoen-
dc.publisherIOP PUBLISHING LTD-
dc.subjectPET-
dc.subjectRESOLUTION-
dc.subjectPERFORMANCE-
dc.subjectSCANNER-
dc.titleEstimation of optimum scintillator thickness of Si-PM detectors for time-of-flight (TOF)-PET-
dc.typeArticle-
dc.contributor.affiliatedAuthorYeom, Jung Yeol-
dc.identifier.doi10.1088/2057-1976/aa635e-
dc.identifier.scopusid2-s2.0-85085971100-
dc.identifier.wosid000411037500028-
dc.identifier.bibliographicCitationBIOMEDICAL PHYSICS & ENGINEERING EXPRESS, v.3, no.2-
dc.relation.isPartOfBIOMEDICAL PHYSICS & ENGINEERING EXPRESS-
dc.citation.titleBIOMEDICAL PHYSICS & ENGINEERING EXPRESS-
dc.citation.volume3-
dc.citation.number2-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaRadiology, Nuclear Medicine & Medical Imaging-
dc.relation.journalWebOfScienceCategoryRadiology, Nuclear Medicine & Medical Imaging-
dc.subject.keywordPlusPET-
dc.subject.keywordPlusRESOLUTION-
dc.subject.keywordPlusPERFORMANCE-
dc.subject.keywordPlusSCANNER-
dc.subject.keywordAuthorPET-
dc.subject.keywordAuthorTOF-
dc.subject.keywordAuthorSi-PM-
dc.subject.keywordAuthorLGSO-
dc.subject.keywordAuthorscintillator-
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