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A Scalable Bandwidth Mismatch Calibration Technique for Time-Interleaved ADCs

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dc.contributor.authorPark, Yunsoo-
dc.contributor.authorKim, Jintae-
dc.contributor.authorKim, Chulwoo-
dc.date.accessioned2021-09-03T17:47:44Z-
dc.date.available2021-09-03T17:47:44Z-
dc.date.created2021-06-16-
dc.date.issued2016-11-
dc.identifier.issn1549-8328-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/87080-
dc.description.abstractThis paper presents a foreground calibration method for both a sampler and a track-and-hold (T/H) buffer bandwidth mismatch in highly time-interleaved analog-to-digital converters (TI-ADCs). The T/H buffer bandwidth mismatch stems from the length difference of interconnect lines between the buffer and the channel ADC, while the sampler bandwidth mismatch arises from the mismatch in a switch and a sampling capacitor. To address both mismatches along with other mismatches residing in TI-ADCs, this papers utilizes least-squares (LS) minimization technique in order to extract mismatch parameters while injecting a sinewave at two distinct frequencies. Programmable capacitor arrays (PCAs) are used to tune the bandwidth of sampler, and correcting buffer bandwidth mismatch is performed in digital-domain. The method presented here is scalable to arbitrary number of interleaved paths, and can easily be combined with existing calibration methods for gain, offset, and timing-skew mismatches. Numerical experiment via Monte-Carlo simulations demonstrates significant performance improvement in the spurious-free dynamic range (SFDR) from 38 dB to 75 dB for a 32-channel time-interleaved ADC model that includes all major mismatches.-
dc.languageEnglish-
dc.language.isoen-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.subjectCONVERTER-
dc.subjectERRORS-
dc.titleA Scalable Bandwidth Mismatch Calibration Technique for Time-Interleaved ADCs-
dc.typeArticle-
dc.contributor.affiliatedAuthorKim, Chulwoo-
dc.identifier.doi10.1109/TCSI.2016.2593927-
dc.identifier.scopusid2-s2.0-84994044001-
dc.identifier.wosid000387356300007-
dc.identifier.bibliographicCitationIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, v.63, no.11, pp.1889 - 1897-
dc.relation.isPartOfIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS-
dc.citation.titleIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS-
dc.citation.volume63-
dc.citation.number11-
dc.citation.startPage1889-
dc.citation.endPage1897-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.subject.keywordPlusCONVERTER-
dc.subject.keywordPlusERRORS-
dc.subject.keywordAuthorAnalog-to-digital conversion-
dc.subject.keywordAuthorbandwidth mismatch-
dc.subject.keywordAuthorchannel mismatch-
dc.subject.keywordAuthortime-interleaved analog-to-digital converters (TI-ADCs) calibration-
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