Evaluation of potential-induced degradation in crystalline Si solar cells using Na fault injection
- Authors
- Oh, Wonwook; Kim, Junhee; Kang, Byungjun; Bae, Soohyun; Lee, Kyung Dong; Lee, Hae-Seok; Kim, Donghwan; Chan, Sung-Il
- Issue Date
- 9월-2016
- Publisher
- PERGAMON-ELSEVIER SCIENCE LTD
- Keywords
- Potential induced degradation; Na fault injection; PV modules; p-Type crystalline solar cells
- Citation
- MICROELECTRONICS RELIABILITY, v.64, pp.646 - 649
- Indexed
- SCIE
SCOPUS
- Journal Title
- MICROELECTRONICS RELIABILITY
- Volume
- 64
- Start Page
- 646
- End Page
- 649
- URI
- https://scholar.korea.ac.kr/handle/2021.sw.korea/87642
- DOI
- 10.1016/j.microrel.2016.07.059
- ISSN
- 0026-2714
- Abstract
- Photovoltaic (PV) modules are exposed to high-voltage stress between grounded module frames and solar cells, a configuration called potential-induced degradation (PID). Since PID mainly depends on the solar cells used for module packaging, several steps for PID tests can be omitted. We carried out PID tests on the cell level with Na fault injection in accordance with IEC 62804 and examined the extent of PID with saturation current density (J(02)) extracted from I-V measurements in the dark. Na-fault injection is a reasonable means for performing PID tests on the cell level without module packaging. (C) 2016 Elsevier Ltd. All rights reserved.
- Files in This Item
- There are no files associated with this item.
- Appears in
Collections - Graduate School of Energy and Environment (KU-KIST GREEN SCHOOL) > Department of Energy and Environment > 1. Journal Articles
- College of Engineering > Department of Materials Science and Engineering > 1. Journal Articles
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.