Control of refractive index by annealing to achieve high figure of merit for TiO2/Ag/TiO2 multilayer films
DC Field | Value | Language |
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dc.contributor.author | Kim, Jae-Ho | - |
dc.contributor.author | Kim, Dae-Hyun | - |
dc.contributor.author | Kim, Sun-Kyung | - |
dc.contributor.author | Bae, Dukkyu | - |
dc.contributor.author | Yoo, Young-Zo | - |
dc.contributor.author | Seong, Tae-Yeon | - |
dc.date.accessioned | 2021-09-03T20:50:08Z | - |
dc.date.available | 2021-09-03T20:50:08Z | - |
dc.date.created | 2021-06-16 | - |
dc.date.issued | 2016-09 | - |
dc.identifier.issn | 0272-8842 | - |
dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/87732 | - |
dc.description.abstract | We modified the refractive index (n) of TiO2 by annealing at various temperatures to obtain a high figure of merit (FOM) for TiO2/TiO2 (45 nm/17 nm/45 nm) multilayer films deposited on glass substrates. Unlike the as-deposited and 300 degrees C-annealed TiO2 films, the 600 degrees C-annealed sample was crystallized in the anatase phase. The as-deposited TiO2/Ag/as-deposited TiO2 multilayer film exhibited a transmittance of 94.6% at 550 nm, whereas that of the as-deposited TiO2/Ag/600 degrees C-annealed TiO2 (lower) multilayer film was 96.6%. At 550 nm, n increased from 2.293 to 2.336 with increasing temperature. The carrier concentration, mobility, and sheet resistance varied with increasing annealing temperature. The samples exhibited smooth surfaces with a root-mean-square roughness of 0.37-1.09 nm. The 600 degrees C-annealed multilayer yielded the highest Haacke's FOM of 193.9 x 10(-3) Omega(-1). (C) 2016 Elsevier Ltd and Techna Group S.r.l. All rights reserved. | - |
dc.language | English | - |
dc.language.iso | en | - |
dc.publisher | ELSEVIER SCI LTD | - |
dc.subject | STRUCTURAL-PROPERTIES | - |
dc.subject | TRANSPARENT | - |
dc.subject | TRANSITION | - |
dc.subject | CONDUCTOR | - |
dc.subject | ELECTRODE | - |
dc.subject | LAYER | - |
dc.title | Control of refractive index by annealing to achieve high figure of merit for TiO2/Ag/TiO2 multilayer films | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Seong, Tae-Yeon | - |
dc.identifier.doi | 10.1016/j.ceramint.2016.06.015 | - |
dc.identifier.scopusid | 2-s2.0-84976448039 | - |
dc.identifier.wosid | 000380081900095 | - |
dc.identifier.bibliographicCitation | CERAMICS INTERNATIONAL, v.42, no.12, pp.14071 - 14076 | - |
dc.relation.isPartOf | CERAMICS INTERNATIONAL | - |
dc.citation.title | CERAMICS INTERNATIONAL | - |
dc.citation.volume | 42 | - |
dc.citation.number | 12 | - |
dc.citation.startPage | 14071 | - |
dc.citation.endPage | 14076 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Ceramics | - |
dc.subject.keywordPlus | STRUCTURAL-PROPERTIES | - |
dc.subject.keywordPlus | TRANSPARENT | - |
dc.subject.keywordPlus | TRANSITION | - |
dc.subject.keywordPlus | CONDUCTOR | - |
dc.subject.keywordPlus | ELECTRODE | - |
dc.subject.keywordPlus | LAYER | - |
dc.subject.keywordAuthor | TiO2 | - |
dc.subject.keywordAuthor | Refractive index | - |
dc.subject.keywordAuthor | Ag | - |
dc.subject.keywordAuthor | Transparent conducting electrode | - |
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