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Practical approach to power integrity-driven design process for power-delivery networks

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dc.contributor.authorKo, Baekseok-
dc.contributor.authorKim, Joowon-
dc.contributor.authorRyoo, Jaemin-
dc.contributor.authorHwang, Chulsoon-
dc.contributor.authorKwon, Chan-Keun-
dc.contributor.authorKim, Soo-Won-
dc.date.accessioned2021-09-03T20:50:19Z-
dc.date.available2021-09-03T20:50:19Z-
dc.date.created2021-06-16-
dc.date.issued2016-09-
dc.identifier.issn1751-858X-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/87733-
dc.description.abstractThe authors present a practical design process that considers the power noise problem in CPU blocks for application processors used in smart TVs. The target impedance is determined by modelling the RLC circuit of a system-on-chip power net. The target impedance of a power delivery network is then determined by applying the extracted chip current profile for finalising the design budget. The authors modelled the on-chip power net by combining vector network analyser measurements with an on-chip model for power integrity analysis. The authors demonstrated the optimisation and design strategy by using a ball grid array ball interconnection and case studies on the placement of multilayer ceramic capacitors. The simulation results showed good agreement with the measurement results. The error in the minimum value (negative direction) by voltage droop was less than 8.6%, while the difference in voltage noise ripple was 2.69% for a criterion of 1.1 V assuming a worst-case condition of 1.2 V.-
dc.languageEnglish-
dc.language.isoen-
dc.publisherINST ENGINEERING TECHNOLOGY-IET-
dc.subjectSUPPLY NOISE-
dc.titlePractical approach to power integrity-driven design process for power-delivery networks-
dc.typeArticle-
dc.contributor.affiliatedAuthorKim, Soo-Won-
dc.identifier.doi10.1049/iet-cds.2015.0285-
dc.identifier.scopusid2-s2.0-84988446651-
dc.identifier.wosid000384185700012-
dc.identifier.bibliographicCitationIET CIRCUITS DEVICES & SYSTEMS, v.10, no.5, pp.448 - 455-
dc.relation.isPartOfIET CIRCUITS DEVICES & SYSTEMS-
dc.citation.titleIET CIRCUITS DEVICES & SYSTEMS-
dc.citation.volume10-
dc.citation.number5-
dc.citation.startPage448-
dc.citation.endPage455-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.subject.keywordPlusSUPPLY NOISE-
dc.subject.keywordAuthordigital television-
dc.subject.keywordAuthormicroprocessor chips-
dc.subject.keywordAuthorintegrated circuit noise-
dc.subject.keywordAuthorsystem-on-chip-
dc.subject.keywordAuthorcircuit optimisation-
dc.subject.keywordAuthorball grid arrays-
dc.subject.keywordAuthorceramic capacitors-
dc.subject.keywordAuthorintegrated circuit modelling-
dc.subject.keywordAuthorRLC circuits-
dc.subject.keywordAuthorintegrated circuit interconnections-
dc.subject.keywordAuthornetwork analysers-
dc.subject.keywordAuthorintegrated circuit design-
dc.subject.keywordAuthorvoltage 1-
dc.subject.keywordAuthor2 V-
dc.subject.keywordAuthorvoltage 1-
dc.subject.keywordAuthor1 V-
dc.subject.keywordAuthorvoltage noise ripple-
dc.subject.keywordAuthorvoltage droop-
dc.subject.keywordAuthormultilayer ceramic capacitors-
dc.subject.keywordAuthorball grid array ball interconnection-
dc.subject.keywordAuthorpower integrity analysis-
dc.subject.keywordAuthoron-chip model-
dc.subject.keywordAuthorvector network analyser measurements-
dc.subject.keywordAuthorchip current profile-
dc.subject.keywordAuthorsystem-on-chip power net-
dc.subject.keywordAuthorRLC circuit-
dc.subject.keywordAuthorsmart TV-
dc.subject.keywordAuthorapplication processors-
dc.subject.keywordAuthorCPU blocks-
dc.subject.keywordAuthorpower noise problem-
dc.subject.keywordAuthorpower-delivery networks-
dc.subject.keywordAuthorpower integrity-driven design process-
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