Tensile Test of an Al Nanowire using In-situ Transmission Electron Microscopy and its Dynamic Deformation Behavior
- Authors
- Kim, Sung-Hoon; Kim, Hong-Kyu; Seo, Jong-Hyun; Lee, Jong-Woon; Hwang, Dong-Mok; Ahn, Jae-Pyoung; Lee, Jae-Chul
- Issue Date
- May-2016
- Publisher
- KOREAN INST METALS MATERIALS
- Keywords
- nanostructured materials; twinning; nanowires; deformation; transmission electron microscopy (TEM)
- Citation
- KOREAN JOURNAL OF METALS AND MATERIALS, v.54, no.5, pp 386 - 389
- Pages
- 4
- Indexed
- SCIE
SCOPUS
KCI
- Journal Title
- KOREAN JOURNAL OF METALS AND MATERIALS
- Volume
- 54
- Number
- 5
- Start Page
- 386
- End Page
- 389
- URI
- https://scholar.korea.ac.kr/handle/2021.sw.korea/88746
- ISSN
- 1738-8228
2288-8241
- Abstract
- Both the deformation behaviors and the associated structural evolution of an Al nanowire were observed by conducting tensile testing in TEM. The Al nanowire exhibited a strength close to the theoretical value and a substantial elastic limit of similar to 5%. Different from bulk-forms of Al, the Al nanowire did not exhibit any quantifiable plastic strain and failed in a brittle manner. This behavior was related to the formation of deformation twins that interlock. Comparative studies were also performed using an Au nanowire to elucidate the effect that the magnitude of the stacking fault energy (SFE) has on the formation of the deformation twins and plasticity.
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