Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Use of antireflection layers to avoid ghost plating on Ni/Cu plated crystalline silicon solar cells

Authors
Jeong, Myeong SangChoi, Sung JinChang, Hyo SikLee, Jeong InKang, Min GuKim, DonghwanSong, Hee-eun
Issue Date
3월-2016
Publisher
IOP PUBLISHING LTD
Citation
JAPANESE JOURNAL OF APPLIED PHYSICS, v.55, no.3
Indexed
SCIE
SCOPUS
Journal Title
JAPANESE JOURNAL OF APPLIED PHYSICS
Volume
55
Number
3
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/89407
DOI
10.7567/JJAP.55.036502
ISSN
0021-4922
Abstract
Screen printing is a method commonly used for making electrodes for crystalline silicon solar cells. Although the screen-printing method is fast and easy, screen-printed electrodes have a porous structure, high contact resistance, and low aspect ratio. On the other hand, plated electrodes have low contact resistance and narrow electrode width. Therefore, the plating method could be substituted for the screen-printing method in crystalline silicon solar cells. During the plating process, ghost plating can appear at the surface when the quality of the passivation layer is poor, causing an increase in the recombination rate. In this paper, light-induced plating was applied to the fabrication of electrodes, and various passivation layers were investigated to remove ghost plating in crystalline silicon solar cells. These included, (1) SiNx deposited by plasma-enhanced chemical vapor deposition (PECVD), (2) a double SiNx layer formed by PECVD, (3) a double layer with thermal silicon oxide and SiNx deposited by PECVD, and (4) a double layer comprising SiNx and SiOx formed by PECVD. For the plated solar cells, a laser was used to remove various antireflection coating (ARC) layers and phosphoric acid was spin-coated onto the doped silicon wafer prior to laser ablation. Also, a screen-printed solar cell was fabricated to compare plated solar cells with screen-printed solar cells. As a result, we found that a thermal SiO2/PECVD SiNx layer showed the lowest pinhole density and its wet vapor transmission rate was characterized. The solar cell with the thermal SiO2/PECVD SiNx layer showed the lowest J(02) value, as well as improved V-oc and J(sc). (C) 2016 The Japan Society of Applied Physics
Files in This Item
There are no files associated with this item.
Appears in
Collections
College of Science and Technology > Department of Electronics and Information Engineering > 1. Journal Articles
College of Engineering > Department of Materials Science and Engineering > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher KIM, Dong hwan photo

KIM, Dong hwan
공과대학 (신소재공학부)
Read more

Altmetrics

Total Views & Downloads

BROWSE