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F-18 Half-life measurement using 2-gamma coincidence method

Authors
Kang, Y. S.Ahn, J. K.Kim, S. H.Byun, J. I.Han, J. B.Lee, K. B.
Issue Date
21-11월-2015
Publisher
ELSEVIER
Keywords
Coincidence measurement; Dead time correction; HPGe detector; F-18
Citation
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, v.801, pp.7 - 10
Indexed
SCIE
SCOPUS
Journal Title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
Volume
801
Start Page
7
End Page
10
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/91875
DOI
10.1016/j.nima.2015.08.025
ISSN
0168-9002
Abstract
The accuracy of the half-life measurement of short-lived radioisotopes such as positron-emitting F-18 (tau(1/2) approximate to 100 min) is limited mainly by inaccuracies in the detector counting statistics. Gamma-ray measurement with a high-activity F-18 source requires counting-loss corrections to compensate for random summing effects and the detector's dead time. In this study, we measure the half-life of F-18 with two 511-keV gamma-rays using two high-purity germanium (HPGe) detectors. The counting-loss corrections are performed via two approaches to address the problems of random coincidence summing and dead time: a half-life measurement with a Na-22 source and a Geant4 simulation of the detector response. Variations in the full-width at half maximum (FWHM) of the 511-keV peak are found to show good correlation with the random summing effect. The half-life of F-18 is estimated as 109.73 +/- 0.14 min. (C) 2015 Elsevier B.V. All rights reserved.
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