False alarm classification for multivariate manufacturing processes of thin film transistor-liquid crystal displays
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kang, Ji Hoon | - |
dc.contributor.author | Kim, Seoung Bum | - |
dc.date.accessioned | 2021-09-04T11:13:29Z | - |
dc.date.available | 2021-09-04T11:13:29Z | - |
dc.date.created | 2021-06-10 | - |
dc.date.issued | 2015-11 | - |
dc.identifier.issn | 0959-1524 | - |
dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/92126 | - |
dc.description.abstract | Control charts have been widely used to improve manufacturing processes by reducing variations and defects. In particular, multivariate control charts have been effectively applied with monitoring processes that contain many correlated variables. Most existing multivariate control charts are vulnerable to mis-classification errors that originate because of the hypothesis tests. In particular, these often cause the generation of a large number of false alarms. In this paper, we propose a procedure to reduce false alarms by combining a multivariate control chart and data mining algorithms. Simulation and real case studies demonstrate that the proposed method effectively reduces the false alarm rate. (C) 2015 Elsevier Ltd. All rights reserved. | - |
dc.language | English | - |
dc.language.iso | en | - |
dc.publisher | ELSEVIER SCI LTD | - |
dc.subject | STATISTICAL PROCESS-CONTROL | - |
dc.subject | NONPARAMETRIC CONTROL CHARTS | - |
dc.subject | T-2 CONTROL CHART | - |
dc.subject | AUTOCORRELATED DATA | - |
dc.subject | FAULT-DIAGNOSIS | - |
dc.title | False alarm classification for multivariate manufacturing processes of thin film transistor-liquid crystal displays | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Kim, Seoung Bum | - |
dc.identifier.doi | 10.1016/j.jprocont.2015.08.009 | - |
dc.identifier.scopusid | 2-s2.0-84941128259 | - |
dc.identifier.wosid | 000364271300003 | - |
dc.identifier.bibliographicCitation | JOURNAL OF PROCESS CONTROL, v.35, pp.21 - 29 | - |
dc.relation.isPartOf | JOURNAL OF PROCESS CONTROL | - |
dc.citation.title | JOURNAL OF PROCESS CONTROL | - |
dc.citation.volume | 35 | - |
dc.citation.startPage | 21 | - |
dc.citation.endPage | 29 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Automation & Control Systems | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalWebOfScienceCategory | Automation & Control Systems | - |
dc.relation.journalWebOfScienceCategory | Engineering, Chemical | - |
dc.subject.keywordPlus | STATISTICAL PROCESS-CONTROL | - |
dc.subject.keywordPlus | NONPARAMETRIC CONTROL CHARTS | - |
dc.subject.keywordPlus | T-2 CONTROL CHART | - |
dc.subject.keywordPlus | AUTOCORRELATED DATA | - |
dc.subject.keywordPlus | FAULT-DIAGNOSIS | - |
dc.subject.keywordAuthor | Multivariate control charts | - |
dc.subject.keywordAuthor | False alarms | - |
dc.subject.keywordAuthor | Classification algorithm | - |
dc.subject.keywordAuthor | TFT-LCD manufacturing process | - |
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