Development of a DAQ system for a plasma display panel-based X-ray detector (PXD)
- Authors
- Lee, Hakjae; Jung, Young-Jun; Eom, Sangheum; Kang, Jungwon; Lee, Kisung
- Issue Date
- 1-6월-2015
- Publisher
- ELSEVIER
- Keywords
- DAQ; Imaging; PXD; FPGA
- Citation
- NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, v.784, pp.213 - 219
- Indexed
- SCIE
SCOPUS
- Journal Title
- NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
- Volume
- 784
- Start Page
- 213
- End Page
- 219
- URI
- https://scholar.korea.ac.kr/handle/2021.sw.korea/93293
- DOI
- 10.1016/j.nima.2014.11.043
- ISSN
- 0168-9002
- Abstract
- Recently, a novel plasma display panel (PDP)-based X-ray detector (PXD) was developed. The goal of this study is to develop a data acquisition system for use with the PXD as an imaging detector. Since the prototype detector does not have any barrier ribs or a switching device in a detector pixel, a novel pixelation scheme the line-scan method is developed for this new detector. To implement line scanning, a multichannel high-voltage switching circuit and a multichannel charge-acquisition circuit are developed. These two circuits are controlled by an FPGA-based digital signal processing board, from which the information about the charge and position of each pixel can be sent to a PC. FPGA-based baseline compensation and switching noise rejection algorithms are used to improve the signal-to-noise ratio (SNR). The characteristic curve of the entire PXD system is acquired, and the correlation coefficients between the X-ray dose, and the signal intensity and the SNR were determined to be approximately 0.99 and 52.9, respectively. (C) 2014 Elsevier B.V. All rights reserved.
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Collections - Graduate School > Department of Bioengineering > 1. Journal Articles
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