Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Investigation of the Key Factors Affecting the Permanent Damage of the REBCO Coated Conductor in Overcurrent Condition

Full metadata record
DC Field Value Language
dc.contributor.authorChoi, Ju Hui-
dc.contributor.authorChoi, Yoon Hyuck-
dc.contributor.authorKang, Dong-Hyung-
dc.contributor.authorPark, Yeonjoo-
dc.contributor.authorSong, Jung-Bin-
dc.contributor.authorHa, Sun-Kyoung-
dc.contributor.authorPark, Minwon-
dc.contributor.authorLee, Haigun-
dc.date.accessioned2021-09-04T15:53:02Z-
dc.date.available2021-09-04T15:53:02Z-
dc.date.created2021-06-16-
dc.date.issued2015-06-
dc.identifier.issn1051-8223-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/93478-
dc.description.abstractThe effects of inhomogeneous critical current (I-c) and n-value on the degradation or permanent damage of REBCO coated conductors (CCs) were investigated through repetitive quench tests and overcurrent tests. In the repetitive quench tests, the I-c values of the REBCO CC samples at the sections with the high n-values were degraded easily due to the existence of thermal stress. Furthermore, the overcurrent test results showed that the REBCO CC samples burned out only at the section with the highest n-value, regardless of their I-c values and the manufacturing process. Therefore, this study confirmed that the n-value of an REBCO CC is one of the essential factors affecting the degradation or permanent damage of CCs in the overcurrent condition.-
dc.languageEnglish-
dc.language.isoen-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.subjectPROGRESS-
dc.titleInvestigation of the Key Factors Affecting the Permanent Damage of the REBCO Coated Conductor in Overcurrent Condition-
dc.typeArticle-
dc.contributor.affiliatedAuthorLee, Haigun-
dc.identifier.doi10.1109/TASC.2014.2365110-
dc.identifier.scopusid2-s2.0-84921487650-
dc.identifier.wosid000369739900001-
dc.identifier.bibliographicCitationIEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, v.25, no.3-
dc.relation.isPartOfIEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY-
dc.citation.titleIEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY-
dc.citation.volume25-
dc.citation.number3-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordPlusPROGRESS-
dc.subject.keywordAuthorCritical current-
dc.subject.keywordAuthordamage-
dc.subject.keywordAuthordegradation-
dc.subject.keywordAuthorinhomogeneity-
dc.subject.keywordAuthorn-value-
dc.subject.keywordAuthorREBCO coated conductors (CCs)-
Files in This Item
There are no files associated with this item.
Appears in
Collections
College of Engineering > Department of Materials Science and Engineering > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Lee, Hai gun photo

Lee, Hai gun
공과대학 (신소재공학부)
Read more

Altmetrics

Total Views & Downloads

BROWSE