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Improving performance of high-power indium gallium nitride/gallium nitride-based vertical light-emitting diodes by employing simple n-type electrode pattern

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dc.contributor.authorYum, Woong-Sun-
dc.contributor.authorSong, June-O-
dc.contributor.authorJeong, Hwan Hee-
dc.contributor.authorOh, Jeong Tak-
dc.contributor.authorSeong, Tae-Yeon-
dc.date.accessioned2021-09-04T18:32:42Z-
dc.date.available2021-09-04T18:32:42Z-
dc.date.created2021-06-15-
dc.date.issued2015-03-
dc.identifier.issn1369-8001-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/94206-
dc.description.abstractIn this work, simple n-type electrode structures were used to enhance the electrical and optical performances of fully packaged commercially mass-produced vertical-geometry light-emitting diodes (VLEDs). The forward bias voltage of the VLED with a Y-pattern electrode increased less rapidly than that of VLEDs with a reference electrode. The VLEDs with the reference and Y-pattern electrodes exhibited forward voltages of 2.93 +/- 0.015 and 2.89 +/- 0.015 V at 350 mA and 3.77 +/- 0.015 and 3.53 +/- 0.015 V at 2000 mA, respectively. The VLEDs with the Y-pattern electrode resulted in a higher light output than the VLEDs with the reference electrode with increase in the drive current to 2000 mA. The emission images showed that the VLEDs with the Y-pattern electrode exhibited better current spreading behavior and lower junction temperatures than the VLEDs with the reference electrode. With increase in the current from 350 to 2000 mA, the VLEDs with the Y-pattern electrode experienced a 39.4% reduction in the wall plug efficiency, whereas the VLEDs with the reference electrode suffered from a 43.3% reduction. (C) 2014 Elsevier Ltd. All rights reserved.-
dc.languageEnglish-
dc.language.isoen-
dc.publisherELSEVIER SCI LTD-
dc.subjectGAN-
dc.subjectENHANCEMENT-
dc.subjectLEDS-
dc.titleImproving performance of high-power indium gallium nitride/gallium nitride-based vertical light-emitting diodes by employing simple n-type electrode pattern-
dc.typeArticle-
dc.contributor.affiliatedAuthorSeong, Tae-Yeon-
dc.identifier.doi10.1016/j.mssp.2014.11.043-
dc.identifier.scopusid2-s2.0-84919772798-
dc.identifier.wosid000350513500029-
dc.identifier.bibliographicCitationMATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, v.31, pp.209 - 213-
dc.relation.isPartOfMATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING-
dc.citation.titleMATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING-
dc.citation.volume31-
dc.citation.startPage209-
dc.citation.endPage213-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalWebOfScienceCategoryPhysics, Condensed Matter-
dc.subject.keywordPlusGAN-
dc.subject.keywordPlusENHANCEMENT-
dc.subject.keywordPlusLEDS-
dc.subject.keywordAuthorVertical LED-
dc.subject.keywordAuthorn-electrode-
dc.subject.keywordAuthorGaN-
dc.subject.keywordAuthorOhmic contact-
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공과대학 (신소재공학부)
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