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A 0.15 V Input Energy Harvesting Charge Pump With Dynamic Body Biasing and Adaptive Dead-Time for Efficiency Improvement

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dc.contributor.authorKim, Jungmoon-
dc.contributor.authorMok, Philip K. T.-
dc.contributor.authorKim, Chulwoo-
dc.date.accessioned2021-09-04T19:28:20Z-
dc.date.available2021-09-04T19:28:20Z-
dc.date.created2021-06-15-
dc.date.issued2015-02-
dc.identifier.issn0018-9200-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/94446-
dc.description.abstractA charge pump using 0.13-mu m CMOS process for low-voltage energy harvesting is presented. A low-power adaptive dead-time (AD) circuit is used which automatically optimizes the dead-time according to the input voltage. A negative charge pump is also utilized for high efficiency at low input voltages (V-IN). The AD circuit improves efficiency by 17% at V-IN of 0.2 V compared to the fixed dead time circuit as well as enables the charge pump to work at VIN down to 0.15 V. Dynamic body bias (DBB) and switch-conductance enhancement techniques are applied to a unit stage of the three-stage charge pump. The reverse current flowing through the cross-coupled NMOS switches is prevented and the current transfer is also maximized. Together with the AD circuit and the DBB technique, the maximum output current was improved by 240% as compared to the conventional charge pump design using only the forward body bias.-
dc.languageEnglish-
dc.language.isoen-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.subjectBOOST CONVERTER-
dc.subjectCMOS-
dc.subjectGENERATION-
dc.subjectDESIGN-
dc.subjectLIMIT-
dc.titleA 0.15 V Input Energy Harvesting Charge Pump With Dynamic Body Biasing and Adaptive Dead-Time for Efficiency Improvement-
dc.typeArticle-
dc.contributor.affiliatedAuthorKim, Chulwoo-
dc.identifier.doi10.1109/JSSC.2014.2375824-
dc.identifier.scopusid2-s2.0-84956571731-
dc.identifier.wosid000349231400002-
dc.identifier.bibliographicCitationIEEE JOURNAL OF SOLID-STATE CIRCUITS, v.50, no.2, pp.414 - 425-
dc.relation.isPartOfIEEE JOURNAL OF SOLID-STATE CIRCUITS-
dc.citation.titleIEEE JOURNAL OF SOLID-STATE CIRCUITS-
dc.citation.volume50-
dc.citation.number2-
dc.citation.startPage414-
dc.citation.endPage425-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.subject.keywordPlusBOOST CONVERTER-
dc.subject.keywordPlusCMOS-
dc.subject.keywordPlusGENERATION-
dc.subject.keywordPlusDESIGN-
dc.subject.keywordPlusLIMIT-
dc.subject.keywordAuthorBody biasing-
dc.subject.keywordAuthorboost converter-
dc.subject.keywordAuthorcharge pump-
dc.subject.keywordAuthorconversion efficiency-
dc.subject.keywordAuthordc-dc converter-
dc.subject.keywordAuthordead-time-
dc.subject.keywordAuthorenergy harvesting-
dc.subject.keywordAuthorlow voltage-
dc.subject.keywordAuthorthreshold voltage-
dc.subject.keywordAuthorvariation-
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