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Effects of dopant and doping concentration on the electrochemical properties of silicon in molten oxide glasses

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dc.contributor.authorHuh, Joo Youl-
dc.date.accessioned2021-08-27T14:37:40Z-
dc.date.available2021-08-27T14:37:40Z-
dc.date.created2021-04-22-
dc.date.issued2019-10-15-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/9742-
dc.publisher한국부식방식학회-
dc.titleEffects of dopant and doping concentration on the electrochemical properties of silicon in molten oxide glasses-
dc.title.alternativeEffects of dopant and doping concentration on the electrochemical properties of silicon in molten oxide glasses-
dc.typeConference-
dc.contributor.affiliatedAuthorHuh, Joo Youl-
dc.identifier.bibliographicCitation2019 International Corrosion Engineering Conference (ICEC2019)-
dc.relation.isPartOf2019 International Corrosion Engineering Conference (ICEC2019)-
dc.relation.isPartOfICEC 2019 abstract books-
dc.citation.title2019 International Corrosion Engineering Conference (ICEC2019)-
dc.citation.conferencePlaceKO-
dc.citation.conferenceDate2019-10-13-
dc.type.rimsCONF-
dc.description.journalClass2-
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공과대학 (신소재공학부)
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