Fine luminescent patterning on ZnO nanowires and films using focused electron-beam irradiation
DC Field | Value | Language |
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dc.contributor.author | Kim, Dong Il | - |
dc.contributor.author | Hong, Young Ki | - |
dc.contributor.author | Lee, Suk Ho | - |
dc.contributor.author | Kim, Jeongyong | - |
dc.contributor.author | Joo, Jinsoo | - |
dc.date.accessioned | 2021-09-05T05:32:20Z | - |
dc.date.available | 2021-09-05T05:32:20Z | - |
dc.date.created | 2021-06-15 | - |
dc.date.issued | 2014-09 | - |
dc.identifier.issn | 1567-1739 | - |
dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/97459 | - |
dc.description.abstract | ZnO thin films and nanowires (NWs) were precisely treated by focused electron-beam (E-beam) irradiation with a line width between 200 nm and 3 mu m. For both ZnO films and NWs, an increased green emission was clearly observed for the E-beam-treated parts. Using a high-resolution laser confocal microscope, the photoluminescence intensities for E-beam-treated ZnO structures increased with increasing dose 1.0 x 10(17)-1.0 x 10(18) electrons/cm(2). The resistivity of a single ZnO NW increased from 56 to 1800 Omega cm after the E-beam treatment. From the results for the annealed ZnO thin films, we analyzed that the variations in PL and resistivity were due to the formation of vacancies upon focused E-beam irradiation. (C) 2014 Elsevier B.V. All rights reserved. | - |
dc.language | English | - |
dc.language.iso | en | - |
dc.publisher | ELSEVIER SCIENCE BV | - |
dc.subject | POINT-DEFECTS | - |
dc.subject | THIN-FILMS | - |
dc.subject | LITHOGRAPHY | - |
dc.subject | GROWTH | - |
dc.title | Fine luminescent patterning on ZnO nanowires and films using focused electron-beam irradiation | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Joo, Jinsoo | - |
dc.identifier.doi | 10.1016/j.cap.2014.06.025 | - |
dc.identifier.scopusid | 2-s2.0-84904313738 | - |
dc.identifier.wosid | 000340557200010 | - |
dc.identifier.bibliographicCitation | CURRENT APPLIED PHYSICS, v.14, no.9, pp.1228 - 1233 | - |
dc.relation.isPartOf | CURRENT APPLIED PHYSICS | - |
dc.citation.title | CURRENT APPLIED PHYSICS | - |
dc.citation.volume | 14 | - |
dc.citation.number | 9 | - |
dc.citation.startPage | 1228 | - |
dc.citation.endPage | 1233 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.identifier.kciid | ART001911018 | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.description.journalRegisteredClass | kci | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.subject.keywordPlus | POINT-DEFECTS | - |
dc.subject.keywordPlus | THIN-FILMS | - |
dc.subject.keywordPlus | LITHOGRAPHY | - |
dc.subject.keywordPlus | GROWTH | - |
dc.subject.keywordAuthor | ZnO | - |
dc.subject.keywordAuthor | Nanowire | - |
dc.subject.keywordAuthor | Focused electron beam | - |
dc.subject.keywordAuthor | Electron irradiation | - |
dc.subject.keywordAuthor | Photoluminescence | - |
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