The degradation of multi-crystalline silicon solar cells after damp heat tests
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Oh, Wonwook | - |
dc.contributor.author | Kim, Seongtak | - |
dc.contributor.author | Bae, Soohyun | - |
dc.contributor.author | Park, Nochang | - |
dc.contributor.author | Kang, Yoonmook | - |
dc.contributor.author | Lee, Hae-Seok | - |
dc.contributor.author | Kim, Donghwan | - |
dc.date.accessioned | 2021-09-05T05:51:45Z | - |
dc.date.available | 2021-09-05T05:51:45Z | - |
dc.date.created | 2021-06-15 | - |
dc.date.issued | 2014-09 | - |
dc.identifier.issn | 0026-2714 | - |
dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/97596 | - |
dc.description.abstract | Lower performance of multi-crystalline silicon solar cells is usually observed after long-term damp heat test at 85 degrees C/85% relative humidity. Performance degradation is known to result from the loss in fill factor (FF) due to high series resistance. The causes of the increase in the series resistance are the reduction of the photovoltaic (PV) ribbon in the solder joint and the oxidation of surface on the front Ag finger by high thermal and moisture stress. Additionally, severe degradation by FF loss after damp heat originated from the contact resistance between Si and Ag fingers. Ag crystallites on Si wafer and bulk Ag at the edge of the Ag finger were partially oxidized and could not play a role in the current path of photo-generated electrons. (C) 2014 Elsevier Ltd. All rights reserved. | - |
dc.language | English | - |
dc.language.iso | en | - |
dc.publisher | PERGAMON-ELSEVIER SCIENCE LTD | - |
dc.subject | CONTACTS | - |
dc.title | The degradation of multi-crystalline silicon solar cells after damp heat tests | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Kang, Yoonmook | - |
dc.contributor.affiliatedAuthor | Lee, Hae-Seok | - |
dc.contributor.affiliatedAuthor | Kim, Donghwan | - |
dc.identifier.doi | 10.1016/j.microrel.2014.07.071 | - |
dc.identifier.wosid | 000345489900107 | - |
dc.identifier.bibliographicCitation | MICROELECTRONICS RELIABILITY, v.54, no.9-10, pp.2176 - 2179 | - |
dc.relation.isPartOf | MICROELECTRONICS RELIABILITY | - |
dc.citation.title | MICROELECTRONICS RELIABILITY | - |
dc.citation.volume | 54 | - |
dc.citation.number | 9-10 | - |
dc.citation.startPage | 2176 | - |
dc.citation.endPage | 2179 | - |
dc.type.rims | ART | - |
dc.type.docType | Article; Proceedings Paper | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalResearchArea | Science & Technology - Other Topics | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.relation.journalWebOfScienceCategory | Nanoscience & Nanotechnology | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.subject.keywordPlus | CONTACTS | - |
dc.subject.keywordAuthor | Photovoltaic module | - |
dc.subject.keywordAuthor | Corrosion | - |
dc.subject.keywordAuthor | Contact resistance | - |
dc.subject.keywordAuthor | Damp heat test | - |
dc.subject.keywordAuthor | Degradation | - |
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
(02841) 서울특별시 성북구 안암로 14502-3290-1114
COPYRIGHT © 2021 Korea University. All Rights Reserved.
Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.