Flexible cadmium telluride thin films grown on electron-beam-irradiated graphene/thin glass substrates
DC Field | Value | Language |
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dc.contributor.author | Seo, Won-Oh | - |
dc.contributor.author | Koo, Yong Hwan | - |
dc.contributor.author | Kim, Byungnam | - |
dc.contributor.author | Lee, Byung Cheol | - |
dc.contributor.author | Kim, Donghwan | - |
dc.contributor.author | Kim, Jihyun | - |
dc.date.accessioned | 2021-09-05T06:05:03Z | - |
dc.date.available | 2021-09-05T06:05:03Z | - |
dc.date.created | 2021-06-15 | - |
dc.date.issued | 2014-08-25 | - |
dc.identifier.issn | 0003-6951 | - |
dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/97661 | - |
dc.description.abstract | We demonstrate the close-spaced sublimation growth of polycrystalline cadmium telluride (CdTe) thin films on a flexible graphene electrode/thin glass substrate structure. Prior to the growth of CdTe films, chemical-vapor-deposited graphene was transferred onto a flexible glass substrate and subjected to electron-beam irradiation at an energy of 0.2 MeV in order to intentionally introduce the defects into it in a controlled manner. Micro-Raman spectroscopy and sheet resistance measurements were employed to monitor the damage and disorder in the electron-beam irradiated graphene layers. The morphology and optical properties of the CdTe thin films deposited on a graphene/flexible glass substrate were systematically characterized. The integration of the defective graphene layers with a flexible glass substrate can be a useful platform to grow various thin-film structures for flexible electronic and optoelectronic devices. (C) 2014 AIP Publishing LLC. | - |
dc.language | English | - |
dc.language.iso | en | - |
dc.publisher | AMER INST PHYSICS | - |
dc.subject | DEFECTS | - |
dc.subject | CARBON | - |
dc.title | Flexible cadmium telluride thin films grown on electron-beam-irradiated graphene/thin glass substrates | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Kim, Donghwan | - |
dc.contributor.affiliatedAuthor | Kim, Jihyun | - |
dc.identifier.doi | 10.1063/1.4893744 | - |
dc.identifier.scopusid | 2-s2.0-84907303503 | - |
dc.identifier.wosid | 000342753500107 | - |
dc.identifier.bibliographicCitation | APPLIED PHYSICS LETTERS, v.105, no.8 | - |
dc.relation.isPartOf | APPLIED PHYSICS LETTERS | - |
dc.citation.title | APPLIED PHYSICS LETTERS | - |
dc.citation.volume | 105 | - |
dc.citation.number | 8 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.subject.keywordPlus | DEFECTS | - |
dc.subject.keywordPlus | CARBON | - |
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