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Single CdTe microwire photodetectors grown by close-spaced sublimation method

Authors
Yang, GwangseokKim, Byung-JaeKim, DonghwanKim, Jihyun
Issue Date
11-8월-2014
Publisher
OPTICAL SOC AMER
Citation
OPTICS EXPRESS, v.22, no.16, pp.18843 - 18848
Indexed
SCIE
SCOPUS
Journal Title
OPTICS EXPRESS
Volume
22
Number
16
Start Page
18843
End Page
18848
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/97693
DOI
10.1364/OE.22.018843
ISSN
1094-4087
Abstract
We demonstrate single CdTe microwire field-effect transistors (FETs) that are highly sensitive to ultraviolet (UV) light. Dense CdTe microwires were catalytically grown using a close-spaced sublimation system. Structural, morphological and transport properties in conjunction with the optoelectronic properties were systemically investigated. CdTe microwire FETs exhibited p-type behaviors with field-effect mobilities up to 1.1 x 10(-3) cm(2) V-1 s(-1). Optoelectronic properties of our CdTe microwire FETs were studied under dark and UV-illumination conditions, where photoresponse was highly dependent on the back-gate bias conditions. Our CdTe microwire FET-based photodetectors are promising for highperformance micro-optoelectronic applications. (C) 2014 Optical Society of America
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