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Delayed < 111 > texture for improving the thermal stability of Ag reflectors for high-performance GaN-based light-emitting diodes
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Sung, Jun-Suk | - |
| dc.contributor.author | Han, Jaecheon | - |
| dc.contributor.author | Noh, Do-Young | - |
| dc.contributor.author | Seong, Tae-Yeon | - |
| dc.date.accessioned | 2021-09-05T08:15:03Z | - |
| dc.date.available | 2021-09-05T08:15:03Z | - |
| dc.date.created | 2021-06-15 | - |
| dc.date.issued | 2014-06 | - |
| dc.identifier.issn | 1359-6462 | - |
| dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/98314 | - |
| dc.description.abstract | The thermal stability of Ag-based reflectors for GaN-based light-emitting diodes (LEDs) was significantly improved by inserting an Mg layer. LEDs fabricated with the Mg-inserted reflector exhibited 22% higher output power (at 20 mA) than LEDs with the Ag-only reflector. The Mg-inserted Ag sample was less < 1 1 1 > textured than the Ag-only sample. Based on scanning electron microscopy and X-ray results, the improved stability is attributed to the delay in the < 1 1 1 > texturing and the modification of the surface energy of Ag films. (C) 2014 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved. | - |
| dc.language | English | - |
| dc.language.iso | en | - |
| dc.publisher | PERGAMON-ELSEVIER SCIENCE LTD | - |
| dc.subject | P-TYPE GAN | - |
| dc.subject | OHMIC CONTACTS | - |
| dc.subject | FILMS | - |
| dc.subject | AGGLOMERATION | - |
| dc.subject | RESISTANCE | - |
| dc.subject | GROWTH | - |
| dc.title | Delayed < 111 > texture for improving the thermal stability of Ag reflectors for high-performance GaN-based light-emitting diodes | - |
| dc.type | Article | - |
| dc.contributor.affiliatedAuthor | Seong, Tae-Yeon | - |
| dc.identifier.doi | 10.1016/j.scriptamat.2014.01.037 | - |
| dc.identifier.scopusid | 2-s2.0-84897912298 | - |
| dc.identifier.wosid | 000335099700002 | - |
| dc.identifier.bibliographicCitation | SCRIPTA MATERIALIA, v.80, pp.5 - 8 | - |
| dc.relation.isPartOf | SCRIPTA MATERIALIA | - |
| dc.citation.title | SCRIPTA MATERIALIA | - |
| dc.citation.volume | 80 | - |
| dc.citation.startPage | 5 | - |
| dc.citation.endPage | 8 | - |
| dc.type.rims | ART | - |
| dc.type.docType | Article | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Science & Technology - Other Topics | - |
| dc.relation.journalResearchArea | Materials Science | - |
| dc.relation.journalResearchArea | Metallurgy & Metallurgical Engineering | - |
| dc.relation.journalWebOfScienceCategory | Nanoscience & Nanotechnology | - |
| dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
| dc.relation.journalWebOfScienceCategory | Metallurgy & Metallurgical Engineering | - |
| dc.subject.keywordPlus | P-TYPE GAN | - |
| dc.subject.keywordPlus | OHMIC CONTACTS | - |
| dc.subject.keywordPlus | FILMS | - |
| dc.subject.keywordPlus | AGGLOMERATION | - |
| dc.subject.keywordPlus | RESISTANCE | - |
| dc.subject.keywordPlus | GROWTH | - |
| dc.subject.keywordAuthor | Semiconductor compounds | - |
| dc.subject.keywordAuthor | Metallizations | - |
| dc.subject.keywordAuthor | Annealing | - |
| dc.subject.keywordAuthor | X-ray diffraction (XRD) | - |
| dc.subject.keywordAuthor | Texture | - |
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