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Characteristic Resistance of No-Insulation and Partial-Insulation Coils With Nonuniform Current Distribution

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dc.contributor.authorYang, Dong Gyu-
dc.contributor.authorHahn, Seungyong-
dc.contributor.authorKim, Youngjae-
dc.contributor.authorKim, Kwang Lok-
dc.contributor.authorSong, Jung-Bin-
dc.contributor.authorBascunan, Juan-
dc.contributor.authorLee, Haigun-
dc.contributor.authorIwasa, Yukikazu-
dc.date.accessioned2021-09-05T08:38:27Z-
dc.date.available2021-09-05T08:38:27Z-
dc.date.created2021-06-15-
dc.date.issued2014-06-
dc.identifier.issn1051-8223-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/98474-
dc.description.abstractThis paper proposes a numerical approach to calculate the characteristic resistance (R-c) of partial-insulation (PI) and no-insulation (NI) high-temperature superconductor pancake coils with the nonuniform current path in such coils taken into consideration. Recently, an analytic approach has been proposed to estimate (R-c) of an NI coil, where the coil current is assumed to be "uniform" over the entire coil. This model, however, is not effective to explain the increase of (R-c) when a coil is modified from NI to PI. In this paper, we first introduce our numerical approach based on a finite element analysis. Then, the charging characteristics of selected PI and NI coils that we had previously reported are analyzed by the proposed approach. Reasonable agreement between the measured and calculated data validates the proposed approach to estimate (R-c) of a PI as well as an NI coil.-
dc.languageEnglish-
dc.language.isoen-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.subjectNUMERICAL-ANALYSIS-
dc.subjectAC LOSSES-
dc.subjectCRITICAL-STATE-
dc.subjectHTS TAPES-
dc.subjectBULK-
dc.subjectSUPERCONDUCTORS-
dc.titleCharacteristic Resistance of No-Insulation and Partial-Insulation Coils With Nonuniform Current Distribution-
dc.typeArticle-
dc.contributor.affiliatedAuthorLee, Haigun-
dc.identifier.doi10.1109/TASC.2013.2285103-
dc.identifier.scopusid2-s2.0-84991706016-
dc.identifier.wosid000332518500370-
dc.identifier.bibliographicCitationIEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, v.24, no.3-
dc.relation.isPartOfIEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY-
dc.citation.titleIEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY-
dc.citation.volume24-
dc.citation.number3-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordPlusNUMERICAL-ANALYSIS-
dc.subject.keywordPlusAC LOSSES-
dc.subject.keywordPlusCRITICAL-STATE-
dc.subject.keywordPlusHTS TAPES-
dc.subject.keywordPlusBULK-
dc.subject.keywordPlusSUPERCONDUCTORS-
dc.subject.keywordAuthorCharacteristic resistance-
dc.subject.keywordAuthorfinite element method (FEM)-
dc.subject.keywordAuthorno-insulation (NI)-
dc.subject.keywordAuthornonuniform current-
dc.subject.keywordAuthorpartial-insulation (PI)-
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