Test-driven forensic analysis of satellite automotive navigation systems
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lim, Kyung-Soo | - |
dc.contributor.author | Lee, Changhoon | - |
dc.contributor.author | Park, Jong Hyuk | - |
dc.contributor.author | Lee, Sang-Jin | - |
dc.date.accessioned | 2021-09-05T10:11:49Z | - |
dc.date.available | 2021-09-05T10:11:49Z | - |
dc.date.created | 2021-06-15 | - |
dc.date.issued | 2014-04 | - |
dc.identifier.issn | 0956-5515 | - |
dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/98902 | - |
dc.description.abstract | The use of satellite automotive navigation systems has increased rapidly worldwide in recent years. Forensic analysis of these devices can be identified information of evidential value in criminal cases. Mappy GPS navigation software is one of the most popular products of satellite navigation software in Korea. Mappy records the usage history, such as the most frequently visited locations and routes, in an external storage medium for convenience and accessibility. These artifacts can be extracted, examined, and analyzed to trace location entries or recent vehicle routes. It can be used to investigate diverse crimes such as kidnap and murder cases; thus, they are of great value in digital forensics. This paper outlines test-driven forensic analysis for Mappy location records and shows how these can be recovered, including deleted location entries. | - |
dc.language | English | - |
dc.language.iso | en | - |
dc.publisher | SPRINGER | - |
dc.title | Test-driven forensic analysis of satellite automotive navigation systems | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Lee, Sang-Jin | - |
dc.identifier.doi | 10.1007/s10845-012-0653-6 | - |
dc.identifier.scopusid | 2-s2.0-84896392819 | - |
dc.identifier.wosid | 000332668100012 | - |
dc.identifier.bibliographicCitation | JOURNAL OF INTELLIGENT MANUFACTURING, v.25, no.2, pp.329 - 338 | - |
dc.relation.isPartOf | JOURNAL OF INTELLIGENT MANUFACTURING | - |
dc.citation.title | JOURNAL OF INTELLIGENT MANUFACTURING | - |
dc.citation.volume | 25 | - |
dc.citation.number | 2 | - |
dc.citation.startPage | 329 | - |
dc.citation.endPage | 338 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Computer Science | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalWebOfScienceCategory | Computer Science, Artificial Intelligence | - |
dc.relation.journalWebOfScienceCategory | Engineering, Manufacturing | - |
dc.subject.keywordAuthor | IT convergence security | - |
dc.subject.keywordAuthor | Digital forensics | - |
dc.subject.keywordAuthor | Satellite navigation analysis | - |
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