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Influence of background oxygen pressure on film properties of pulsed laser deposited Y:BaZrO3
- Authors
- Bae, Kiho; Jang, Dong Young; Choi, Sung Min; Kim, Byung-Kook; Lee, Jong-Ho; Son, Ji-Won; Shim, Joon Hyung
- Issue Date
- 3-2월-2014
- Publisher
- ELSEVIER SCIENCE SA
- Keywords
- Proton-conducting ceramics; Solid oxide fuel cells; Pulse-laser deposition; Yttrium-doped barium zirconate; Oxygen pressure; Transmission electron microscopy; Electrochemical impedance spectroscopy; Grain-boundary depletion
- Citation
- THIN SOLID FILMS, v.552, pp.24 - 31
- Indexed
- SCIE
SCOPUS
- Journal Title
- THIN SOLID FILMS
- Volume
- 552
- Start Page
- 24
- End Page
- 31
- ISSN
- 0040-6090
- Abstract
- Yttrium-doped barium zirconate (Y:BaZrO3, BZY) thin films were prepared using pulsed laser deposition (PLD) on MgO substrates at 700 degrees C by varying the ambient oxygen pressure. The microstructure and electrical properties were then investigated using transmission electron microscopy and electrochemical impedance spectroscopy. Dense, well-crystallized BZY films were produced at ambient oxygen pressures (P-amb,P-o2) of <= 6.67 Pa. At P-amb,P- (2)(o) = 13.3 Pa, conical amorphous defects and porous microstructures were observed in the films. The conductivity of PLD BZY prepared at P-amb,P-o2 <= 13.3 Pa was measured to be close to that of reference polycrystalline BZY films, and the grain-boundary properties governed the overall ion conduction, with nano-grains being covered by the space charge depletion zones. At P-amb,P-o2 >= 13.3 Pa, microstructural defects significantly degraded the electrical properties. (C) 2013 Elsevier B.V. All rights reserved.
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