Measurement of low-energy and low-charge ultrashort bunches using an S-band RF deflector

  • Park, Sunjeong; 
  • Kim, Hyun Woo; 
  • Kim, Mi Hye; 
  • Kim, Young Chan; 
  • Baek, In Hyung; 
  • ... Park, Seong Hee; 
  • 외 5명
Citations

WEB OF SCIENCE

5
Citations

SCOPUS

7

초록

Ultrafast Electron Diffraction (UED) system, using an electron bunch of the duration with less than 100 fs and of the energy with 3 MeV, has been developed as a tool probing the ultrafast dynamics in pump-probe experiments. To keep the temporal and transverse characteristics of the electron bunch for the time-resolved electron diffraction, the bunch charge is limited to be the pico-Coulomb or less. S-band transverse deflecting cavity working on T M-120 mode is designed, fabricated, and installed in the UED system to measure directly the fs-scaled pulse duration of low-energy and low-charge electron bunches. We describe the design and the expected performance of a single-cell RF deflector. For the electron beam of 3 MeV in energy and 1.88 pC in charge, we could measure the bunch duration of 69 fs and the timing jitter of 62 fs, both in rms.

키워드

RF deflector; Electron duration measurement; Ultrashort bunch measurement; Ultrafast electron diffraction system
제목
Measurement of low-energy and low-charge ultrashort bunches using an S-band RF deflector
저자
Park, Sunjeong; Kim, Hyun Woo; Kim, Mi Hye; Kim, Young Chan; Baek, In Hyung; Jang, Kyu-Ha; Kim, Eun-San; Kim, Hongjoo; Vinokurov, Nikolay A.; Jeong, Young Uk; Park, Seong Hee
DOI
10.1016/j.nima.2019.01.087
발행일
2019-05-21
유형
Article
저널명
Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
권
927
페이지
194 ~ 201