Measurement of low-energy and low-charge ultrashort bunches using an S-band RF deflector

  • Park, Sunjeong
  • Kim, Hyun Woo
  • Kim, Mi Hye
  • Kim, Young Chan
  • Baek, In Hyung
  • ... Park, Seong Hee
  • 외 5명
Citations

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5
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SCOPUS

7

초록

Ultrafast Electron Diffraction (UED) system, using an electron bunch of the duration with less than 100 fs and of the energy with 3 MeV, has been developed as a tool probing the ultrafast dynamics in pump-probe experiments. To keep the temporal and transverse characteristics of the electron bunch for the time-resolved electron diffraction, the bunch charge is limited to be the pico-Coulomb or less. S-band transverse deflecting cavity working on T M-120 mode is designed, fabricated, and installed in the UED system to measure directly the fs-scaled pulse duration of low-energy and low-charge electron bunches. We describe the design and the expected performance of a single-cell RF deflector. For the electron beam of 3 MeV in energy and 1.88 pC in charge, we could measure the bunch duration of 69 fs and the timing jitter of 62 fs, both in rms.

키워드

RF deflectorElectron duration measurementUltrashort bunch measurementUltrafast electron diffraction system
제목
Measurement of low-energy and low-charge ultrashort bunches using an S-band RF deflector
저자
Park, SunjeongKim, Hyun WooKim, Mi HyeKim, Young ChanBaek, In HyungJang, Kyu-HaKim, Eun-SanKim, HongjooVinokurov, Nikolay A.Jeong, Young UkPark, Seong Hee
DOI
10.1016/j.nima.2019.01.087
발행일
2019-05-21
유형
Article
저널명
Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
927
페이지
194 ~ 201