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Measurement of low-energy and low-charge ultrashort bunches using an S-band RF deflector
- Park, Sunjeong;
- Kim, Hyun Woo;
- Kim, Mi Hye;
- Kim, Young Chan;
- Baek, In Hyung;
- ... Park, Seong Hee;
- 외 5명
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7초록
Ultrafast Electron Diffraction (UED) system, using an electron bunch of the duration with less than 100 fs and of the energy with 3 MeV, has been developed as a tool probing the ultrafast dynamics in pump-probe experiments. To keep the temporal and transverse characteristics of the electron bunch for the time-resolved electron diffraction, the bunch charge is limited to be the pico-Coulomb or less. S-band transverse deflecting cavity working on T M-120 mode is designed, fabricated, and installed in the UED system to measure directly the fs-scaled pulse duration of low-energy and low-charge electron bunches. We describe the design and the expected performance of a single-cell RF deflector. For the electron beam of 3 MeV in energy and 1.88 pC in charge, we could measure the bunch duration of 69 fs and the timing jitter of 62 fs, both in rms.
키워드
- 제목
- Measurement of low-energy and low-charge ultrashort bunches using an S-band RF deflector
- 저자
- Park, Sunjeong; Kim, Hyun Woo; Kim, Mi Hye; Kim, Young Chan; Baek, In Hyung; Jang, Kyu-Ha; Kim, Eun-San; Kim, Hongjoo; Vinokurov, Nikolay A.; Jeong, Young Uk; Park, Seong Hee
- 발행일
- 2019-05-21
- 유형
- Article
- 권
- 927
- 페이지
- 194 ~ 201