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Estimation of optimum scintillator thickness of Si-PM detectors for time-of-flight (TOF)-PET
- Nakanishi, Kouhei;
- Kodani, Kanako;
- Yeom, Jung Yeol;
- Yamamoto, Seiichi
WEB OF SCIENCE
1SCOPUS
2초록
Time-of-flight (TOF) is an effective method for improving signal-to-noise ratio of the images for PET. Basic performance of TOF-PET such as sensitivity, TOF-gain, and energy resolution depends on the scintillator thickness. Hence, determining the appropriate scintillator thickness is crucial when designing TOF-PET systems. However, the optimal thickness for the Lu-based scintillators is often not clear-cut. In this paper, we introduce a new concept (figure of merit, FOM) to evaluate the optimum scintillator thickness with regards to the above factors for a TOF-PET system employing Lu-based scintillators coupled to silicon photomultipliers (Si-PMs). We optically coupled Lu1.9Gd0.1SiO5 (LGSO) scintillators of different thickness (length) to Si-PMs and measured the timing resolutions with a high bandwidth digital oscilloscope. Then we calculated the TOF-gain for each crystal. We also calculated the coincidence detection efficiencies. Finally, for each LGSO length, we evaluated the relative sensitivity with FOMs that take into account the TOF-gain (TOF-sensitivity). From this study, we found that LGSO with 20-25 mm thickness was optimum based on the calculated TOF-sensitivity FOM. We conclude that the evaluation methods and results can provide an objective method in which one may use to determine the optimum thickness of the scintillators for TOF-PET systems.
키워드
- 제목
- Estimation of optimum scintillator thickness of Si-PM detectors for time-of-flight (TOF)-PET
- 저자
- Nakanishi, Kouhei; Kodani, Kanako; Yeom, Jung Yeol; Yamamoto, Seiichi
- 발행일
- 2017-04
- 유형
- Article
- 권
- 3
- 호
- 2
- 언어
- ENG
- 출판사
- IOP PUBLISHING LTD
- 발행국가
- 영국
- ISSN
- E 2057-1976
P 2057-1976