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Similarity-based Local Feature Extraction for Wafer Bin Map Pattern Recognition
Similarity-based Local Feature Extraction for Wafer Bin Map Pattern Recognition
- 제목
- Similarity-based Local Feature Extraction for Wafer Bin Map Pattern Recognition
- 제목 (타언어)
- Similarity-based Local Feature Extraction for Wafer Bin Map Pattern Recognition
- 저자
- Jun-Geol Baek
- 발행일
- 2022-02-22
- 학회명
- The 4th International Conference on Artificial Intelligence in Information and Communication (ICAIIC 2022)
- 개최지
- Jeju, Korea
- 개최국가
- 대한민국
- 학회 개최일
- 2022-02-21 ~ 2022-02-24