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Super steep-switching (SS approximate to 2 mV/decade) phase-FinFET with Pb(Zr0.52Ti0.48)O-3 threshold switching device
- Shin, Jaemin;
- Ko, Eunah;
- Park, June;
- Kim, Seung-Geun;
- Lee, Jae Woo;
- ... Yu, Hyun-Yong;
- 외 1명
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10초록
A Pb(Zr0.52Ti0.48)O-3 (PZT) threshold-switching (TS) device with abrupt resistive switching (similar to 5 to 6 orders) at a threshold voltage of similar to 1.1 V and high off-state resistance (approximately 1 x 10(10)Omega) is demonstrated. The thermal, productive, and operational reliability of the PZT TS device is investigated. Furthermore, a PZT-based phase transition fin-shaped field-effect-transistor (phase-FinFET) is demonstrated. Compared against a baseline FinFET, the PZT-based phase-FinFET improves the on/off current ratio by a factor of 27.5 and exhibits an extremely abrupt steep-switching characteristic (subthreshold slope of similar to 2 mV/decade at 300 K). Published by AIP Publishing.
키워드
NEGATIVE CAPACITANCE; VOLTAGE; SLOPE
- 제목
- Super steep-switching (SS approximate to 2 mV/decade) phase-FinFET with Pb(Zr0.52Ti0.48)O-3 threshold switching device
- 저자
- Shin, Jaemin; Ko, Eunah; Park, June; Kim, Seung-Geun; Lee, Jae Woo; Yu, Hyun-Yong; Shin, Changhwan
- 발행일
- 2018-09-03
- 유형
- Article
- 권
- 113
- 호
- 10