Possibility of Transport Through a Single Acceptor in a Gate-All-Around Silicon Nanowire PMOSFET

  • Hong, Byoung Hak
  • Jung, Young Chai
  • Rieh, Jae Sung
  • Hwang, Sung Woo
  • Cho, Keun Hwi
  • 외 8명
Citations

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초록

Temperature-dependent electrical transport measurements of cylindrical shaped gate-all-around silicon nanowire p-channel MOSFET were performed. At 4.2 K, they show current oscillations, which can be analyzed by single hole tunneling originated from nanowire quantum dots. In addition to this single hole tunneling, one device exhibited strong current peaks, surviving even at room temperature. The separations between these current peaks corresponded to the energy of 25 and 26 meV. These values were consistent with the sum of the bound-state energy spacing and the charging energy of a single boron atom. The radius calculated from the obtained single-atom charging energy was also comparable to the light-hole Bohr radius.

키워드

Gate-all-around (GAA)silicon nanowire FET (SNWFET)single-acceptor atomtemperature dependence
제목
Possibility of Transport Through a Single Acceptor in a Gate-All-Around Silicon Nanowire PMOSFET
저자
Hong, Byoung HakJung, Young ChaiRieh, Jae SungHwang, Sung WooCho, Keun HwiYeo, K. H.Suk, S. D.Yeoh, Y. Y.Li, M.Kim, Dong-WonPark, DonggunOh, Kyung SeokLee, Won-Seong
DOI
10.1109/TNANO.2009.2021844
발행일
2009-11
유형
Article
저널명
IEEE Transactions on Nanotechnology
8
6
페이지
713 ~ 717