Electrical and structural characterizations of non-polar AlGaN/GaN heterostructures

  • Jung, Younghun
  • Mastro, Michael
  • Hite, Jennifer
  • Eddy, Charles R., Jr.
  • Kim, Jihyun
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초록

A non-polar AlGaN/GaN structure is a strong candidate for the high-voltage device that can operate in enhancement-mode compared to the depletion-mode operation that is practically unavoidable for a standard polar AlGaN/GaN structure. Growth of non-polar GaN is non-trivial and a two-step nucleation scheme was developed to produce high-quality non-polar a-plane AlGaN/GaN structures on r-plane sapphire. The anisotropic nature of non-polar GaN requires a modification to a typical polar GaN-based transistor fabrication process. A KOH wet etch proceeded by a dramatically different mechanism compared to the standard polar c-face AlGaN/GaN structure. This device with Pt/Au Schottky gate displayed a barrier height of 0.76 eV and an ideality factor of 4 at 20 degrees C. (C) 2009 Elsevier B.V. All rights reserved.

키워드

Gallium nitrideNon-polar structureSchottky contactScanning electron microscopyX-ray diffractionMetal-organic chemical vapor depositionGANENHANCEMENTTRANSISTORSMECHANISMLEAKAGEGATE
제목
Electrical and structural characterizations of non-polar AlGaN/GaN heterostructures
저자
Jung, YounghunMastro, MichaelHite, JenniferEddy, Charles R., Jr.Kim, Jihyun
DOI
10.1016/j.tsf.2009.11.069
발행일
2010-01-01
유형
Article
저널명
Thin Solid Films
518
6
페이지
1747 ~ 1750