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초록
A non-polar AlGaN/GaN structure is a strong candidate for the high-voltage device that can operate in enhancement-mode compared to the depletion-mode operation that is practically unavoidable for a standard polar AlGaN/GaN structure. Growth of non-polar GaN is non-trivial and a two-step nucleation scheme was developed to produce high-quality non-polar a-plane AlGaN/GaN structures on r-plane sapphire. The anisotropic nature of non-polar GaN requires a modification to a typical polar GaN-based transistor fabrication process. A KOH wet etch proceeded by a dramatically different mechanism compared to the standard polar c-face AlGaN/GaN structure. This device with Pt/Au Schottky gate displayed a barrier height of 0.76 eV and an ideality factor of 4 at 20 degrees C. (C) 2009 Elsevier B.V. All rights reserved.
키워드
- 제목
- Electrical and structural characterizations of non-polar AlGaN/GaN heterostructures
- 저자
- Jung, Younghun; Mastro, Michael; Hite, Jennifer; Eddy, Charles R., Jr.; Kim, Jihyun
- 발행일
- 2010-01-01
- 유형
- Article
- 저널명
- Thin Solid Films
- 권
- 518
- 호
- 6
- 페이지
- 1747 ~ 1750