Quantitative Measurement with Scanning Thermal Microscope by Preventing the Distortion Due to the Heat Transfer through the Air

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초록

Because of its high spatial resolution, scanning thermal microscopy (SThM) has been developed quite actively and applied in such diverse areas as microelectronics, optoelectronics, polymers, and carbon nanotubes for more than a decade since the 1990s. However, despite its long history and diverse areas of application, surprisingly, no quantitative profiling method has been established yet. This is mostly due to the nonlocal nature of measurement by conventional SThM: the signal measured by SThM is Induced not only from the local heat flux through the tip sample thermal contact but also (and mostly) from the heat flux through the air gap between the sample and the SThM probe. In this study, a rigorous but simple and practical theory for quantitative SThM for local measurement Is established and verified experimentally using high-performance SThM probes. The development of quantitative SThM will make possible new breakthroughs in diverse fields of nanothermal science and engineering.

키워드

scanning thermal microscopythermocouple probequantitative profilingtemperaturethermal conductivityPROPERTY IMAGING TECHNIQUEPHONON TRANSPORTLAYER GRAPHENE2-OMEGA METHODCONDUCTIVITYMECHANISMSCONTACTSFAILUREDEVICESPROBES
제목
Quantitative Measurement with Scanning Thermal Microscope by Preventing the Distortion Due to the Heat Transfer through the Air
저자
Kim, KyeongtaeChung, JaehunHwang, GwangseokKwon, OhmyoungLee, Joon Sik
DOI
10.1021/nn2026325
발행일
2011-11
유형
Article
저널명
ACS Nano
5
11
페이지
8700 ~ 8709